公开(公告)号：US11781855B2

公开(公告)日：2023-10-10

申请号：US17186860

申请日：2021-02-26

申请人： Lyle G. Shirley

发明人： Lyle G. Shirley

IPC分类号： G01B11/02 ,  G01B9/02004 ,  A61B5/117 ,  G06F21/32 ,  G06T7/55 ,  G01B9/02055 ,  G01B9/02 ,  G01B11/24 ,  G01B9/02002 ,  G06T7/521 ,  G01B11/14 ,  G06V10/143 ,  G06F18/25 ,  G06V10/80 ,  A61B5/00

CPC分类号： G01B9/02004 ,  A61B5/117 ,  G01B9/02005 ,  G01B9/02069 ,  G01B9/02083 ,  G01B9/02094 ,  G01B9/02096 ,  G01B11/14 ,  G01B11/2441 ,  G06F18/253 ,  G06F21/32 ,  G06T7/521 ,  G06T7/55 ,  G06V10/143 ,  G06V10/806 ,  A61B5/0077 ,  A61B2576/00 ,  G06T2207/10152

摘要： Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of outputting wavelength emissions to create a first illumination state to illuminate a surface and create a first speckle pattern, an emission deviation facility capable of influencing the emission to illuminate the surface and create a second illumination state and a second speckle pattern, and a sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern. Also disclosed are methods of sensing properties of the surface, one embodiment comprising the steps of illuminating the surface having a first surface state with the source of coherent radiation emission, sensing a first speckle intensity from the surface, influencing a relationship of the surface to the emission to create a second surface state and sensing a second speckle intensity from the surface at the second surface state.

公开(公告)号：US20210356250A1

公开(公告)日：2021-11-18

申请号：US17186860

申请日：2021-02-26

申请人： Lyle G. Shirley

发明人： Lyle G. Shirley

IPC分类号： G01B9/02 ,  A61B5/117 ,  G06F21/32 ,  G06K9/20 ,  G06K9/62 ,  G06T7/55 ,  G01B11/24 ,  G06T7/521 ,  G01B11/14

摘要： Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of outputting wavelength emissions to create a first illumination state to illuminate a surface and create a first speckle pattern, an emission deviation facility capable of influencing the emission to illuminate the surface and create a second illumination state and a second speckle pattern, and a sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern. Also disclosed are methods of sensing properties of the surface, one embodiment comprising the steps of illuminating the surface having a first surface state with the source of coherent radiation emission, sensing a first speckle intensity from the surface, influencing a relationship of the surface to the emission to create a second surface state and sensing a second speckle intensity from the surface at the second surface state.

公开(公告)号：US10935364B2

公开(公告)日：2021-03-02

申请号：US16357263

申请日：2019-03-18

申请人： Lyle G. Shirley

发明人： Lyle G. Shirley

IPC分类号： G01B11/02 ,  G01B9/02 ,  A61B5/117 ,  G06F21/32 ,  G06K9/20 ,  G06K9/62 ,  G06T7/55 ,  G01B11/24 ,  G06T7/521 ,  G01B11/14 ,  A61B5/00

摘要： Disclosed are systems and methods to extract information about the size and shape of an object by observing variations of the radiation pattern caused by illuminating the object with coherent radiation sources and changing the wavelengths of the source. Sensing and image-reconstruction systems and methods are described for recovering the image of an object utilizing projected and transparent reference points and radiation sources such as tunable lasers. Sensing and image-reconstruction systems and methods are also described for rapid sensing of such radiation patterns. A computational system and method is also described for sensing and reconstructing the image from its autocorrelation. This computational approach uses the fact that the autocorrelation is the weighted sum of shifted copies of an image, where the shifts are obtained by sequentially placing each individual scattering cell of the object at the origin of the autocorrelation space.