Display panel and display apparatus

    公开(公告)号:US12142210B2

    公开(公告)日:2024-11-12

    申请号:US17789566

    申请日:2021-09-30

    Abstract: A display panel includes a base substrate, a driving circuit layer on the base substrate and a light emitting structure layer, the driving circuit layer includes a plurality of circuit units, and the light emitting structure layer includes a plurality of light emitting devices; at least one circuit unit includes a plurality of initial signal lines and a pixel driving circuit including a plurality of transistors, which includes at least one oxide thin film transistor and at least one low-temperature polycrystalline silicon thin film transistor; the plurality of initial signal lines each include a signal sub-line in a first direction, at least one initial signal line includes a signal sub-line extending in a second direction intersecting with the first direction; the signal sub-line extending in the first direction and the signal sub-line extending in the second direction of the initial signal line are electrically connected to each other.

    Data processing method, device and system, and electronic device

    公开(公告)号:US12055914B2

    公开(公告)日:2024-08-06

    申请号:US17781127

    申请日:2020-10-30

    CPC classification number: G05B19/406 G05B2219/32204

    Abstract: A data processing method includes: obtaining a defect type of a sample set in response to a first input of a user on a first interface, the sample set including samples, each sample having a first parameter used to represent a defect degree of the sample with regard to the defect type and a second parameter used to represent device informations of sample production devices through which the sample passes; calculating yield purity indexes of sample production devices on the samples based on first parameters and second parameters of the samples, so as to obtain influencing parameters of the sample production devices, an influencing parameter of each sample production device being used to represent an influence degree to which the sample production device affects an occurrence of the defect type on the samples; and displaying the influencing parameters of the sample production devices on a second interface.

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