公开(公告)号：US11695410B2

公开(公告)日：2023-07-04

申请号：US17478925

申请日：2021-09-19

Applicant: Yung-Lin Chen ,  Szu-Chieh Su ,  Lien-Sheng Hung ,  Chun-Tai Cheng ,  Hsi-Ping Tsai ,  Szu-Hsin Yeh

Inventor： Yung-Lin Chen ,  Szu-Chieh Su ,  Lien-Sheng Hung ,  Chun-Tai Cheng ,  Hsi-Ping Tsai ,  Szu-Hsin Yeh

IPC: H03K17/56

CPC classification number: H03K17/56

Abstract: Herein disclosed is a voltage isolation circuit coupled to power supplies. The voltage isolation circuit comprises a series switch group controlled by a first control signal, a parallel switch group controlled by a second control signal, and a first high impedance element. The series switch group comprises a transistor arranged in a first current loop and having two channels connected to one of the power supplies respectively. The first high impedance element, coupled to the transistor in parallel, has a measurement terminal and two ends, connected to one of the power supplies respectively. When the series switch group is conducted, the power supplies are coupled in series in the first current loop. When the parallel switch group is conducted, the power supplies are coupled in parallel in a second current loop. Impedance values measured from the measurement terminal to each end of the first high impedance element are identical.

公开(公告)号：US11686669B2

公开(公告)日：2023-06-27

申请号：US17748084

申请日：2022-05-19

Applicant: Tsung-Hsien Ou ,  Hsin-Yueh Sung ,  Shih-Min Hsu ,  Yu-Hsuan Lin

Inventor： Tsung-Hsien Ou ,  Hsin-Yueh Sung ,  Shih-Min Hsu ,  Yu-Hsuan Lin

IPC: G02B27/10 ,  G01N21/25 ,  G02B27/14 ,  G01N21/27

CPC classification number: G01N21/255 ,  G01N21/27 ,  G02B27/1013 ,  G02B27/141

Abstract: The invention provides an optical measurement device for measuring light to be inspected. The optical measurement device comprises a light receiving module, a light splitting module, and a plurality of color filters. The light receiving module is used for converting the light to be inspected into a first parallel light. The light splitting module is used for splitting the first parallel light into a plurality of parallel lights to be inspected. Each color filter receives at least one of the plurality of parallel lights to be inspected. The plurality of parallel lights to be inspected filtered by the plurality of color filters are used to calculate tristimulus values in the CIE color space.

公开(公告)号：US11630147B2

公开(公告)日：2023-04-18

申请号：US17551246

申请日：2021-12-15

Applicant: CHROMA ATE INC.

Inventor： Ming Cheng Huang ,  Tsung-I Lin ,  Hui-Jung Wu ,  Chien-Ming Chen

IPC: G01R31/28 ,  G01R1/04

Abstract: The present invention relates to a low-thermal resistance pressing device for a socket, which mainly comprises a housing, an inner collar, a heat conductive pressing block, a bearing collar and a locking member. The locking member on the housing is used to lock the socket. The inner collar is threadedly engaged with the housing. The bearing collar is located between the inner collar and the heat conductive pressing block. In the case of rotating the inner collar in the housing, the bearing collar drives the heat conductive pressing block to move axially so as to exert an axial force to a device to be tested. Because the heat conductive pressing block protrudes from the upper and lower surfaces of the housing, one end thereof can be in contact with a temperature control module, and the other end thereof can be in contact with the device to be tested.

公开(公告)号：US20220157639A1

公开(公告)日：2022-05-19

申请号：US17521952

申请日：2021-11-09

Applicant: Chroma Ate Inc.

Inventor： CHIEN-MING CHEN ,  CHIN-YI OUYANG

IPC: H01L21/683 ,  H01L21/677

Abstract: The present invention relates to a chip transfer device capable of floatingly positioning a chip and a method for floatingly positioning a chip. When a chip is placed in a chip socket, a control unit controls an air pressure switching valve to allow at least one vent hole to be communicated with a positive air pressure source. An air flow from the positive air pressure source blows a lower surface of the chip through the vent hole, so that the at least one chip is air-floated. Accordingly, when the chip socket is communicated with the positive air pressure source, the air flow blows the lower surface of the chip in the chip socket through the vent hole, so that the chip is air-floated in the chip socket to reduce the error displacement of the chip offset.

公开(公告)号：US20220136970A1

公开(公告)日：2022-05-05

申请号：US17476595

申请日：2021-09-16

Applicant: CHROMA ATE INC.

Inventor： HSUAN-AN CHEN ,  CHI-MING WEN

IPC: G01N21/64 ,  G01J3/44 ,  G01J3/02

Abstract: A fluorescence detection system is provided and adapted to provide a selectable excitation beam to an optical transmission path for irradiation of a device under test, including a driving module, a lighting module, a first optical module and a second optical module. The driving module includes a first shaft and a second shaft parallel thereto. The lighting module is fixed to the first shaft. The first optical module and the second optical module are fixed to the second shaft. A driving operation enables the driving module to rotate the lighting module, the first optical module and the second optical module simultaneously, determining quickly a combination of one light source, one filter and one spectroscopic module on the optical transmission path, with the combination corresponding in position to the device under test, so as to reduce the volume and cost the fluorescence detection system.

公开(公告)号：US11061067B2

公开(公告)日：2021-07-13

申请号：US16509671

申请日：2019-07-12

Applicant: Chroma Ate Inc.

Inventor： Xin-Yi Wu

IPC: G01R31/28

Abstract: An apparatus and a method provide a high temperature test and a low temperature test. The apparatus mainly includes a depressing head and a test base, wherein the depressing head includes a cooling module, a heating module, and a heat dissipation module therein, the heat dissipation module includes a finned heat sink and a heat conduction member, and the heat conduction member is thermally coupled to the heating module and the finned heat sink. When the low temperature test is performed, an electronic component is cooled by filling liquid nitrogen into the cooling module of the depressing head. When the high temperature test is performed, the electronic component is heated by the heating module. If the temperature of the electronic device is higher than a predetermined high temperature, the electronic device is cooled by the heat dissipation module.

公开(公告)号：US20210197405A1

公开(公告)日：2021-07-01

申请号：US17063752

申请日：2020-10-06

Applicant: Chroma Ate Inc.

Inventor： Chien-Ming CHEN ,  Meng-Kung LU ,  Ming-Yuan HUANG

IPC: B25J17/02 ,  B25J15/06 ,  B25J9/10

Abstract: A rotatable cushioning pick-and-place device primarily comprises a motor, a body, a cushioning module and a pick-and-place module. The cushioning module is disposed in a first chamber of the body and comprises a rotary bearing which is connected to a drive shaft of the motor, and coupled to a driven shaft sleeve through a rotary follower. The rotary follower is driven by the rotary bearing to drive the driven shaft sleeve to rotate, thereby allowing the rotary bearing to displace relative to the driven shaft sleeve axially. The cushioning spring is arranged between the rotary bearing and the driven shaft sleeve. A first sealing ring and a second sealing ring of the pick-and-place module are fixed on the body to cooperatively and air-tightly seal the second chamber.

公开(公告)号：US10890624B2

公开(公告)日：2021-01-12

申请号：US16180158

申请日：2018-11-05

Applicant: CHROMA ATE INC.

Inventor： Chuan-Tse Lin ,  Ming-Tsung Liu ,  Kuan-Chen Chen ,  Chien-Po Lin

IPC: G01R31/36 ,  H01M10/48 ,  G01R31/387 ,  G01R31/396 ,  H01M10/44

Abstract: A testing fixture for a cell temperature probe includes a microcomputer, a temperature probe, a measurement case, a temperature instrument and heaters. The microcomputer configured to receive a control command for executing a testing process. The measurement case has an outer surface and an inner surface. The outer surface includes a probe-contacting area used for being contacted by the cell temperature probe within a formation device in the testing process. The temperature instrument is electrically connected to the microcomputer and has a sensing terminal disposed on the inner surface of the measurement case. The location of the sensing terminal is aligned with the probe-contacting area in a direction of a thickness of the measurement case. The heaters are electrically connected to the microcomputer and thermally to the measurement case.

公开(公告)号：US10825588B2

公开(公告)日：2020-11-03

申请号：US16594073

申请日：2019-10-07

Applicant: Chung-Lin Liu ,  Chien-Hsin Huang ,  Wen-Chung Chen

Inventor： Chung-Lin Liu ,  Chien-Hsin Huang ,  Wen-Chung Chen

IPC: H01C1/14 ,  H01C1/084

Abstract: Herein disclosed is a voltage dividing resistor comprising a resistance bar and a plurality of dividing connectors. The resistance bar has a first end and a second end and provides a first current path, which stretches from the first end to the second end along the resistance bar. The distance between the first end and the second end is less than the length of the first current path. The first and second ends are configured to be electrically connected to a power source. The dividing connectors are electrically connected to different locations on the first current path. Each of the dividing connectors has a contact pad. The resistance bar is not coplanar with the contact pads. A divided voltage is obtained from a pair of dividing connectors chosen from the plurality of dividing connectors.

公开(公告)号：US10527671B2

公开(公告)日：2020-01-07

申请号：US15846031

申请日：2017-12-18

Applicant: CHROMA ATE INC.

Inventor： Po-Kai Cheng

IPC: G01R31/28 ,  G01R1/067

Abstract: An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.