Abstract:
A wavelength stabilization control device for controlling a light-wave output by a tunable component in an optical communication system, including a beam splitting component, a first photo-detecting component, a second photo-detecting component, a Fabry-Perot Etalon and an optical filtering component. The beam splitting component splits the light-wave into a first light-wave and a second light-wave. The first photo-detecting component receives the first light-wave and transforms the first light-wave into a first electric signal. The second photo-detecting component receives the second light-wave and transforms the second light-wave into a second electric signal. The Fabry-Perot Etalon is provided between the beam splitting component and the second photo-detecting component for separating a light-wave including a specific wavelength from the second light-wave. The optical filtering component is provided between the Fabry-Perot Etalon and the second photo-detecting component for filtering a part of channels out from the light-wave including the specific wavelength.
Abstract:
Apparatus and methods are provided for measuring a selected optical behavior of a tunable opto-electric device by using the electrical characteristics of the opto-electronic device. The benefit of the present invention is the elimination or reduction in complexity of optical wavelength reference hardware that is currently required for wavelength referencing and locking. Accordingly, the present invention reduces the cost and complexity of the optical packaging of tunable opto-electronic telecommunication components. Furthermore, the present invention also significantly simplifies optical and electronic design of system level products with tunable opto-electronic devices.
Abstract:
A light wavelength meter (10) able to accept light into a light diverter (16) and impart to it a transverse displacement characteristic which can be detected in a light detection unit (20) connected to a processor (22). Optionally, a light diverger (18) may be provided to enhance angular resolution. The light diverter (16) and the light diverger (18) may either transmit or reflect the light. The light diverter (16) may include a diffraction grating (116, 156), Fabry-Perot interferometer (216), multiple slit plate (316), or an acousto-optical unit (416). The processor (22) may employ wavelength data look-up tables, including addressed based on light intensity and the first defivative of light intensity.
Abstract:
A light frequency locker (10) able to accept a light beam (14) generated by a controllable light source (12) into a light diverter (16) and impart to it a transverse displacement characteristic which can be detected in a light detection unit (20) connected to a processor (22). The processor (22) then controls the light source (12). Optionally, a light diverger (18) may be provided to enhance angular resolution. The light diverter (16) and the light diverger (18) may either transmit or reflect the light. The light diverter (16) may particularly include a diffraction grating (116, 156), Fabry-Perot interferometer (216), multiple slit plate (316), or an acousto-optical unit (416).
Abstract:
A high-precision etalon and novel method of construction thereof is presented. The etalon comprises a pair of plane-parallel flat mirrors spaced a first distance apart, a pair of plane-parallel spacers transversely attached to the pair of mirrors which operate to fix the first distance between the pair of mirrors, and a thin film mirror layer deposited on at least one of the pair of plane-parallel flat mirrors to form a laser cavity therein of a precise second distance apart. The method of constructing an etalon in accordance with the invention includes the steps of fabricating one or more spacers, measuring the length of the spacer(s), and deriving a dimensional deviation of the spacer length from a nominal cavity dimension specified for the etalon. A thin-film pedestal is then deposited on one, the other, or both of a first and second substrate and then coated with a reflective coating. The etalon is then assembled using the spacer(s) and first and second substrates.