Wavelength stabilizing control device and method thereof
    41.
    发明申请
    Wavelength stabilizing control device and method thereof 审中-公开
    波长稳定控制装置及其方法

    公开(公告)号:US20040120721A1

    公开(公告)日:2004-06-24

    申请号:US10664015

    申请日:2003-09-16

    Abstract: A wavelength stabilization control device for controlling a light-wave output by a tunable component in an optical communication system, including a beam splitting component, a first photo-detecting component, a second photo-detecting component, a Fabry-Perot Etalon and an optical filtering component. The beam splitting component splits the light-wave into a first light-wave and a second light-wave. The first photo-detecting component receives the first light-wave and transforms the first light-wave into a first electric signal. The second photo-detecting component receives the second light-wave and transforms the second light-wave into a second electric signal. The Fabry-Perot Etalon is provided between the beam splitting component and the second photo-detecting component for separating a light-wave including a specific wavelength from the second light-wave. The optical filtering component is provided between the Fabry-Perot Etalon and the second photo-detecting component for filtering a part of channels out from the light-wave including the specific wavelength.

    Abstract translation: 一种波长稳定控制装置,用于控制光通信系统中的可调组件的光波输出,包括分束组件,第一光检测组件,第二光检测组件,法布里 - 珀罗埃隆和光学 过滤组件。 分束组件将光波分解为第一光波和第二光波。 第一光检测部件接收第一光波并将第一光波变换为第一电信号。 第二光检测部件接收第二光波,并将第二光波变换为第二电信号。 在分束组件和第二光检测组件之间设置法布里 - 珀罗埃隆,用于将包括特定波长的光波与第二光波分离。 光学滤波部件设置在法布里 - 珀罗埃隆和第二光检测部件之间,用于从包括特定波长的光波滤出一部分通道。

    Electronic method and apparatus for measuring optical wavelength and locking to a set optical wavelength of fabry-perot tunable cavity opto-electronic devices
    42.
    发明申请
    Electronic method and apparatus for measuring optical wavelength and locking to a set optical wavelength of fabry-perot tunable cavity opto-electronic devices 失效
    用于测量光学波长并锁定到fabry-perot可调谐腔光电器件的设定光学波长的电子方法和装置

    公开(公告)号:US20030076083A1

    公开(公告)日:2003-04-24

    申请号:US10264060

    申请日:2002-10-03

    Inventor: Yakov Kogan

    Abstract: Apparatus and methods are provided for measuring a selected optical behavior of a tunable opto-electric device by using the electrical characteristics of the opto-electronic device. The benefit of the present invention is the elimination or reduction in complexity of optical wavelength reference hardware that is currently required for wavelength referencing and locking. Accordingly, the present invention reduces the cost and complexity of the optical packaging of tunable opto-electronic telecommunication components. Furthermore, the present invention also significantly simplifies optical and electronic design of system level products with tunable opto-electronic devices.

    Abstract translation: 提供了通过使用光电器件的电特性来测量可调谐光电器件的选定光学特性的装置和方法。 本发明的优点是消除或降低了当前波长参考和锁定所需的光学波长参考硬件的复杂性。 因此,本发明降低了可调谐光电通信部件的光学封装的成本和复杂性。 此外,本发明还显着简化了具有可调谐光电器件的系统级产品的光学和电子设计。

    Light wavelength meter
    43.
    发明申请
    Light wavelength meter 有权
    光波长计

    公开(公告)号:US20030057351A1

    公开(公告)日:2003-03-27

    申请号:US10286701

    申请日:2002-10-31

    Applicant: Fibera, Inc.

    Inventor: John C. Tsai

    Abstract: A light wavelength meter (10) able to accept light into a light diverter (16) and impart to it a transverse displacement characteristic which can be detected in a light detection unit (20) connected to a processor (22). Optionally, a light diverger (18) may be provided to enhance angular resolution. The light diverter (16) and the light diverger (18) may either transmit or reflect the light. The light diverter (16) may include a diffraction grating (116, 156), Fabry-Perot interferometer (216), multiple slit plate (316), or an acousto-optical unit (416). The processor (22) may employ wavelength data look-up tables, including addressed based on light intensity and the first defivative of light intensity.

    Abstract translation: 一种光波长计(10),其能够将光接收到光分路器(16)中并向其施加横向位移特性,其可以在连接到处理器(22)的光检测单元(20)中检测。 可选地,可以提供光发散器(18)以增强角度分辨率。 光分路器(16)和光分路器(18)可以传输或反射光。 光分路器(16)可以包括衍射光栅(116,156),法布里 - 珀罗干涉仪(216),多个狭缝板(316)或声光单元(416)。 处理器(22)可以使用波长数据查找表,其包括基于光强度寻址并且首先确定光强度。

    Light frequency locker
    44.
    发明申请
    Light frequency locker 有权
    光频储物柜

    公开(公告)号:US20020122444A1

    公开(公告)日:2002-09-05

    申请号:US09798721

    申请日:2001-03-01

    Inventor: John C. Tsai

    Abstract: A light frequency locker (10) able to accept a light beam (14) generated by a controllable light source (12) into a light diverter (16) and impart to it a transverse displacement characteristic which can be detected in a light detection unit (20) connected to a processor (22). The processor (22) then controls the light source (12). Optionally, a light diverger (18) may be provided to enhance angular resolution. The light diverter (16) and the light diverger (18) may either transmit or reflect the light. The light diverter (16) may particularly include a diffraction grating (116, 156), Fabry-Perot interferometer (216), multiple slit plate (316), or an acousto-optical unit (416).

    Abstract translation: 一种能够将由可控光源(12)产生的光束(14)接收到光转向器(16)中并向其赋予横向位移特性的光频锁定器(10),该横向位移特性可在光检测单元 20)连接到处理器(22)。 然后,处理器(22)控制光源(12)。 可选地,可以提供光发散器(18)以增强角度分辨率。 光分路器(16)和光分路器(18)可以传输或反射光。 光分路器(16)可以特别地包括衍射光栅(116,156),法布里 - 珀罗干涉仪(216),多个狭缝板(316)或声光单元(416)。

    High-precision etalon device and method of construction
    45.
    发明授权
    High-precision etalon device and method of construction 有权
    高精度标准装置及其施工方法

    公开(公告)号:US06379984B1

    公开(公告)日:2002-04-30

    申请号:US09466755

    申请日:1999-12-17

    Abstract: A high-precision etalon and novel method of construction thereof is presented. The etalon comprises a pair of plane-parallel flat mirrors spaced a first distance apart, a pair of plane-parallel spacers transversely attached to the pair of mirrors which operate to fix the first distance between the pair of mirrors, and a thin film mirror layer deposited on at least one of the pair of plane-parallel flat mirrors to form a laser cavity therein of a precise second distance apart. The method of constructing an etalon in accordance with the invention includes the steps of fabricating one or more spacers, measuring the length of the spacer(s), and deriving a dimensional deviation of the spacer length from a nominal cavity dimension specified for the etalon. A thin-film pedestal is then deposited on one, the other, or both of a first and second substrate and then coated with a reflective coating. The etalon is then assembled using the spacer(s) and first and second substrates.

    Abstract translation: 提出了一种高精度标准具及其新颖的构造方法。 标准具包括一对间隔开第一距离的平面平行的平面镜,横向附接到一对反射镜的一对平面平行的间隔件,其操作以固定该对反射镜之间的第一距离,以及薄膜镜层 沉积在一对平面平行平镜中的至少一个上,以在其间形成精确的第二距离的激光腔。 根据本发明的构造标准具的方法包括以下步骤:制造一个或多个间隔物,测量间隔物的长度,以及导出间隔物长度与为标准具指定的标称腔体尺寸的尺寸偏差。 然后将薄膜基座沉积在第一和第二基板的一个,另一个或两个基板上,然后涂覆有反射涂层。 然后使用间隔件和第一和第二基板组装标准具。

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