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    Optical computing devices comprising rotatable broadband angle-selective filters
    42.
    发明授权
    Optical computing devices comprising rotatable broadband angle-selective filters 有权

    公开(公告)号：US09746584B2

    公开(公告)日：2017-08-29

    申请号：US15316871

    申请日：2015-04-15

    Applicant: Halliburton Energy Services, Inc.

    Inventor： James M. Price ,  David L. Perkins

    IPC: E21B49/08 ,  G01V8/20 ,  G01V5/08

    CPC classification number: G01V8/20 ,  E21B47/123 ,  E21B49/08 ,  G01N21/31 ,  G01V5/08

    Abstract: An optical computing device comprising a plurality of electromagnetic radiation sources, each at a unique angular displacement about an optical train and each at at least one unique electromagnetic radiation wavelength; an integrated computational element (ICE) located in the optical train before or after a sample located in the optical train to generate modified electromagnetic radiation in the optical train; a broadband angle-selective filter (BASF) located in the optical train that is rotatable about an axis to a plurality of unique orientations to transmit the electromagnetic radiation and/or the modified electromagnetic radiation in the optical train at a target incident angle corresponding to one of the plurality of electromagnetic radiation sources to generate angle selected-modified electromagnetic radiation (ASMR); and a detector to receive the ASMR and to generate an output signal corresponding to a characteristic of the sample.

    INTEGRATED COMPUTATIONAL ELEMENT FABRICATION METHODS AND SYSTEMS
    43.
    发明申请
    INTEGRATED COMPUTATIONAL ELEMENT FABRICATION METHODS AND SYSTEMS 审中-公开
    综合计算元件制造方法与系统

    公开(公告)号：US20160291633A1

    公开(公告)日：2016-10-06

    申请号：US15036400

    申请日：2013-12-02

    Applicant: HALLIBURTON ENERGY SERVICES, INC.

    Inventor： James M. Price

    IPC: G06E3/00 ,  G05B19/402 ,  G01B11/06

    CPC classification number: G06E3/001 ,  G01B11/0633 ,  G05B19/402 ,  G05B2219/49021 ,  G06E3/00

    Abstract: Methods and systems for manufacturing optical computing elements, including a method for correcting element layer thickness measurements during manufacturing that includes depositing an element layer on a glass substrate or a previously deposited layer, illuminating the deposited layer and sampling reflected or transmitted light produced by said illuminating, detecting and measuring an actual magnitude of the sampled light as a function of wavelength, and modeling the sampled light to produce a predicted magnitude of the sampled light. The method further includes determining a discrepancy between the actual and predicted magnitudes, adjusting the actual magnitude based on said discrepancy, calculating the thickness of the deposited layer based upon the adjusted actual magnitude of the sampled light, and adjusting the deposited layer's thickness if the calculated thickness is not within a tolerance range of a target thickness.

    Abstract translation: 用于制造光学计算元件的方法和系统，包括用于在制造期间校正元件层厚度测量的方法，包括在玻璃基底或先前沉积的层上沉积元件层，照射沉积层并对由所述照明产生的反射或透射光进行采样 检测和测量作为波长的函数的采样光的实际幅度，以及对采样光进行建模以产生采样光的预测幅度。 该方法还包括确定实际和预测幅度之间的差异，基于所述差异来调整实际幅度，基于经调整的采样光的实际幅度来计算沉积层的厚度，以及如果计算的 厚度不在目标厚度的公差范围内。

    OPTICAL TRANSMISSION/REFLECTION MODE IN-SITU DEPOSITION RATE CONTROL FOR ICE FABRICATION
    44.
    发明申请
    OPTICAL TRANSMISSION/REFLECTION MODE IN-SITU DEPOSITION RATE CONTROL FOR ICE FABRICATION 有权
    用于制冰的光传输/反射模式现场存储速率控制

    公开(公告)号：US20160130696A1

    公开(公告)日：2016-05-12

    申请号：US14432844

    申请日：2014-05-08

    Applicant: Halliburton Energy Services, Inc.

    Inventor： James M. Price ,  Aditya B. Nayak ,  David L. Perkins

    IPC: C23C14/54 ,  G01B11/06 ,  G02B1/12 ,  G01N21/41 ,  C23C14/30 ,  G02B5/28

    CPC classification number: C23C14/54 ,  C23C14/22 ,  C23C14/30 ,  C23C14/545 ,  C23C14/547 ,  G01B11/06 ,  G01N21/41 ,  G02B1/12 ,  G02B5/285

    Abstract: Systems and methods of controlling a deposition rate during thin-film fabrication are provided. A system as provided may include a chamber, a material source contained within the chamber, an electrical component to activate the material source, a substrate holder to support the multilayer stack and at least one witness sample. The system may further include a measurement device and a computational unit. The material source provides a layer of material to the multilayer stack and to the witness sample at a deposition rate controlled at least partially by the electrical component and based on a correction value obtained in real-time by the computational unit. In some embodiments, the correction value is based on a measured value provided by the measurement device and a computed value provided by the computational unit according to a model.

    Abstract translation: 提供了在薄膜制造期间控制沉积速率的系统和方法。 所提供的系统可以包括腔室，容纳在腔室内的材料源，用于激活材料源的电气部件，用于支撑多层叠层的衬底保持器和至少一个见证样品。 该系统还可以包括测量装置和计算单元。 材料源以至少部分地由电气部件控制的沉积速率并且基于由计算单元实时获得的校正值，向多层叠层和见证样品提供一层材料。 在一些实施例中，校正值基于由测量装置提供的测量值和由计算单元根据模型提供的计算值。

    SYSTEM AND METHODS FOR DOWNHOLE PROPERTY MEASUREMENT
    47.
    发明申请
    SYSTEM AND METHODS FOR DOWNHOLE PROPERTY MEASUREMENT 有权

    公开(公告)号：US20220341320A1

    公开(公告)日：2022-10-27

    申请号：US17852137

    申请日：2022-06-28

    Applicant: Halliburton Energy Services, Inc.

    Inventor： Michel Joseph LeBlanc ,  Bin Dai ,  James M. Price

    IPC: E21B49/08 ,  G01N21/21 ,  G01N21/31 ,  G01N21/80

    Abstract: Embodiments of a device, system and method are disclosed herein. In one embodiment, a device comprises a sample cell configured to interact a fluid sample with an ion selective substrate to modify an optical characteristic of the ion selective substrate according to an ion concentration of the fluid sample, wherein the sample cell is also configured to optically interact an illumination light with the ion selective substrate to generate a sample light; an optical element configured to interact with the sample light to provide a modified light that has a property of the fluid sample; and a detector that receives the modified light and provides an electrical signal proportional to the property of the fluid sample indicated by the modified light; and wherein the ion selective substrate comprises a membrane, the membrane configured to change an optical property in a selected wavelength range, according to the property of the fluid sample.

    Optical sensor adaptive calibration
    48.
    发明授权
    Optical sensor adaptive calibration 有权

    公开(公告)号：US11467314B2

    公开(公告)日：2022-10-11

    申请号：US16464244

    申请日：2018-07-16

    Applicant: Halliburton Energy Services, Inc.

    Inventor： Dingding Chen ,  Christopher Michael Jones ,  Bin Dai ,  Megan Pearl ,  James M. Price

    IPC: G01V8/10 ,  E21B49/08 ,  G01N21/25 ,  G01V13/00 ,  G01V99/00

    Abstract: The subject disclosure provides for a method of optical sensor calibration implemented with neural networks through machine learning to make real-time optical fluid answer product prediction adapt to optical signal variation of synthetic and actual sensor inputs integrated from multiple sources. Downhole real-time fluid analysis can be performed by monitoring the quality of the prediction with each type of input and determining which type of input generalizes better. The processor can bypass the less robust routine and deploy the more robust routine for remainder of the data prediction. Operational sensor data can be incorporated from a particular optical tool over multiple field jobs into an updated calibration when target fluid sample compositions and properties become available. Reconstructed fluid models adapted to prior field job data, in the same geological or geographical area, can maximize the likelihood of quality prediction on future jobs and optimize regional formation sampling and testing applications.

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