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公开(公告)号:US09995930B2
公开(公告)日:2018-06-12
申请号:US15093987
申请日:2016-04-08
Inventor: Amir Arbabi , Seunghoon Han , Andrei Faraon
CPC classification number: G02B27/0031 , G02B3/0087 , G02B5/0263 , G02B5/0294 , G02B5/1876 , G02B5/3083 , G02B23/00 , G02B27/005 , G02B27/0927 , G02B27/0955 , G02B27/4216 , G02B27/4272
Abstract: A focusing device includes a substrate and a plurality of scatterers provided at both sides of the substrate. The scatterers on the both sides of the focusing device may correct geometric aberration, and thus, a field of view (FOV) of the focusing device may be widened.
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公开(公告)号:US09891355B2
公开(公告)日:2018-02-13
申请号:US15139268
申请日:2016-04-26
Applicant: CALIFORNIA INSTITUTE OF TECHNOLOGY
Inventor: Amir Arbabi , Andrei Faraon
IPC: G02B26/00 , G02B5/13 , G02B5/136 , H04B10/50 , H04B10/40 , G02F1/01 , H04B10/516 , H04B10/112
CPC classification number: G02B5/13 , G02B5/136 , G02F1/01 , H04B10/1123 , H04B10/40 , H04B10/501 , H04B10/516
Abstract: A retroreflector device is described, which includes a lens component operable for focusing radiation, which is incident thereto at an angle of incidence. The retroreflector also includes a mirror component operable for reflecting the radiation focused by the lens component back along the angle of incidence. The lens component and/or the mirror component includes a quasi-periodic array of elements, each of which comprises a dimension smaller than a wavelength of the radiation.
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公开(公告)号:US09739918B2
公开(公告)日:2017-08-22
申请号:US14852450
申请日:2015-09-11
Applicant: CALIFORNIA INSTITUTE OF TECHNOLOGY
Inventor: Amir Arbabi , Andrei Faraon
CPC classification number: G02B5/3025 , G02B5/021 , G02B5/0215 , G02B5/0278 , G02B5/3083
Abstract: Methods and device for controlling optical scattering are disclosed. An array of 4-fold asymmetric cylinders can act as optical elements scattering electromagnetic waves, where the orientation and dimension of each optical element is determined according to the desired polarization and phase shift response of the device. A Jones matrix can be calculated to determine the fabrication parameters of the optical elements.
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