Abstract:
A particle beam position monitor includes first and second pairs of plates mounted normal with respect to the longitudinal axis of the particle beam on opposite sides thereof. The associated plates of each of the first and second pairs are fixedly spatially mounted with respect to each other and each have one edge positioned to lie in a single plane parallel to the longitudinal axis of the particle beam. A pair of voltage sources are connected to produce potentials between the associated plates of the first and second pairs respectively and a pair of electrometers measure secondary electron emission from the pairs of plates in the presence of the particle beam. A bridge circuit differentially combines the measured secondary electron emission to provide a relative measure of the position of the particle beam.