Abstract:
A system and method for calibrating light output from an LED is provided. The system includes a support on which an LED is positioned, a photosensor to measure the light output from the LED, and means for calibrating and adjusting the light output of the LED. Calibration is accomplished by measuring the light output from the LED, comparing such output against a reference value, and adjusting the measured output against the reference value.
Abstract:
To control chroma and brightness in a backlight module, a plurality of reference values of a plurality of monochromatic light beams are provided, and a brightness reference value is provided for the light formed of the monochromatic light beams. Then, a plurality of first light signals of the monochromatic light beams, and a second light signal of the light formed of the monochromatic light beams are sensed and compared with the reference values and the brightness reference value, respectively. Finally, the monochromatic light beams outputted by the plurality of LEDs is calibrated according to a comparison result of the plurality of first light signals with the plurality of reference values and a comparison result of the second light signal with the brightness reference value.
Abstract:
This invention belongs to the luminous flux measurement field, and especially relates to the equipment and method for LED's total luminous flux measurement with a narrow beam standard light source. The system for LED's total luminous flux measurement with a narrow beam standard light source in this invention comprises an integrating sphere, the light source, a narrow aperture fiber, a spectrometer and a driver for the light source. The light source is lighted by the driver. The narrow beam standard light source (both luminous flux standard and spectrum standard) is placed on the interior surface of integrating sphere, there is not any baffle in the sphere, and a narrow aperture fiber transfers the light to a multi-channel spectrometer which measures the spectrum distribution of LED and calculates its total luminous flux. The equipment in this invention is easy to use, has small error and low cost, and can achieve accurate results for LED's total luminous flux.
Abstract:
To control chroma and brightness in a backlight module, a plurality of reference values of a plurality of monochromatic light beams are provided, and a brightness reference value is provided for the light formed of the monochromatic light beams. Then, a plurality of first light signals of the monochromatic light beams, and a second light signal of the light formed of the monochromatic light beams are sensed and compared with the reference values and the brightness reference value, respectively. Finally, the monochromatic light beams outputted by the plurality of LEDs is calibrated according to a comparison result of the plurality of first light signals with the plurality of reference values and a comparison result of the second light signal with the brightness reference value.
Abstract:
A system and method for calibrating light output from an LED is provided. The system includes a support on which an LED is positioned, a photosensor to measure the light output from the LED, and means for calibrating and adjusting the light output of the LED. Calibration is accomplished by measuring the light output from the LED, comparing such output against a reference value, and adjusting the measured output against the reference value.
Abstract:
An illuminator suitable for accurate colorimetric work in electronic imaging and traditional photograghic environments uses an integrating chamber, a plurality of light emitting diodes (LEDs) and a controller for controlling the emitted energy form the LED. An LED support member assures that the beam of energy will be directed along a predetermined path between the energy inlet end and energy outlet end of the integrating chamber. Energy of a predetermined wavelength is filtered from entering the integrating chamber.
Abstract:
A method and a system for controlling a RBG based LED luminary which tracks the tristimulus values of both feedback and reference whereby the forward currents driving the LED luminary are adjusted in accordance with the errors between the feed tristimulus values and the reference tristimulus values until the errors are zero.
Abstract:
An optical inspection device comprises an optical measurement unit, a first probe disposed under the optical measurement unit and providing a first voltage, a base frame disposed under the optical measurement unit and spaced apart from the first probe, and a second probe disposed on a surface of the base frame which faces the first probe, providing a second voltage different from the first voltage, and having a plate shape in plan view.
Abstract:
A sensing system comprising a light filtering apparatus configured to pass a first wavelength of light corresponding to an emission spectrum characteristic of Mercury. The sensing system comprises a sensor configured to receive light passed by the light filtering apparatus and produce a sensor response that is indicative of the light passed by the light filtering apparatus. The sensing system comprises a processor configured to use the sensor response to distinguish between light emitted by a fluorescent light source and light emitted by a light emitting diode.
Abstract:
A chip chuck includes front and back slopes obliquely extending toward a bottom surface from front and back edges of a top surface having a chip placement area for supporting a chip under test, and is defined with an imaginary vertical reference line perpendicular to the chip placement area and an imaginary horizontal reference line. The front and back slopes are connected with the chip placement area and each provided with an included acute angle with respect to the imaginary horizontal reference line, thereby avoiding interference with light emitted from the chip. A chip supporting device includes a chip chuck, and an optical sensing module fixed relative thereto and including an optical sensor whose light receiving surface faces toward a back light emitting surface of the chip, thereby enabling optical characteristic inspection of front and back light emitting surfaces of the chip at the same time.