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公开(公告)号：US20180075906A1
公开(公告)日：2018-03-15
申请号：US15805109
申请日：2017-11-06
发明人： Shine C. Chung
CPC分类号： G11C13/0069 , G11C13/0004 , G11C13/0007 , G11C13/004 , G11C17/16 , G11C17/18 , G11C2213/72 , G11C2213/74
摘要： Building programmable resistive devices in contact holes at the crossover of a plurality of conductor lines in more than two vertical layers is disclosed. There are plurality of first conductor lines and another plurality of second conductor lines that can be substantially perpendicular to each other, though in two different vertical layers. A diode and/or a programmable resistive element can be fabricated in the contact hole between the first and second conductor lines. The programmable resistive element can be coupled to another programmable resistive device or shared between two programmable devices whose diodes conducting currents in opposite directions and/or coupled to a common conductor line. The programmable resistive memory can be configured to be programmable by applying voltages to conduct current flowing through the programmable resistive element to change its resistance for a different logic state.
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公开(公告)号：US20180005703A1
公开(公告)日：2018-01-04
申请号：US15708116
申请日：2017-09-18
发明人： Shine C. Chung
CPC分类号： G11C17/16 , G11C7/222 , G11C17/18 , G11C29/027 , H01L27/224 , H01L27/2409 , H01L45/06 , H01L45/1233 , H01L45/144
摘要： A method of programming electrical fuses reliably is disclosed. If a programming current exceeds a critical current, disruptive mechanisms such as rupture, thermal runaway, decomposition, or melt, can be a dominant programming mechanism such that programming is not be very reliable. Advantageously, by controlled programming where programming current is maintained below the critical current, electromigration can be the sole programming mechanism and, as a result, programming can be deterministic and very reliable. In this method, fuses can be programmed in multiple shots with progressive resistance changes to determine a lower bound that all fuses can be programmed satisfactorily and an upper bound that at least one fuse can be determined failed. If programming within the lower and upper bounds, defects due to programming can be almost zero and, therefore, defects are essentially determined by pre-program defects.
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