Thin film transistor substrate, method of inspecting the same, and display device including the same
    21.
    发明授权
    Thin film transistor substrate, method of inspecting the same, and display device including the same 有权
    薄膜晶体管基板,其检查方法以及包括该薄膜晶体管基板的显示装置

    公开(公告)号:US09508274B2

    公开(公告)日:2016-11-29

    申请号:US13895794

    申请日:2013-05-16

    CPC classification number: G09G3/006 H01L27/1251

    Abstract: A thin film transistor substrate, includes: pixels disposed in a display area of the thin film transistor substrate and connected to gate lines and data lines; gate pad parts connected to first ends of the gate lines; first test transistors each being connected to a second end of a corresponding gate line of the gate lines; data pad parts connected to first ends of the data lines; and second test transistors each being connected to a second end of a corresponding data line of the data lines. The gate pad parts, the data pad parts, the first test transistors, and the second test transistors are disposed in a non-display area of the thin film transistor substrate. The first test transistors are configured to be switched to receive a first inspection signal and the second test transistors are configured to be switched to receive a second inspection signal.

    Abstract translation: 一种薄膜晶体管基板,包括:设置在薄膜晶体管基板的显示区域中并连接到栅极线和数据线的像素; 栅极焊盘部分连接到栅极线的第一端; 每个第一测试晶体管连接到栅极线的对应栅极线的第二端; 数据焊盘部分连接到数据线的第一端; 并且每个第二测试晶体管连接到数据线的相应数据线的第二端。 栅极焊盘部分,数据焊盘部分,第一测试晶体管和第二测试晶体管设置在薄膜晶体管衬底的非显示区域中。 第一测试晶体管被配置为被切换以接收第一检查信号,并且第二测试晶体管被配置为被切换以接收第二检查信号。

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