-
公开(公告)号：US07334460B2
公开(公告)日：2008-02-26
申请号：US11382438
申请日：2006-05-09
CPC分类号： G01Q70/16 , G01B5/28 , G01D5/26 , G01Q10/02 , G01Q10/04 , G01Q10/06 , G01Q70/02 , G01Q70/08 , G01Q80/00
摘要： A method and apparatus for manipulating the surface of a sample including a cantilever, a first tip mounted on the cantilever, and a second tip mounted on the cantilever, the first and the second tip being configured to combine to form an imaging probe and to separate to form a manipulation probe. The first and second tips are configured to form a first position characterized in that the tips combine to form an imaging tip and the first and the second tip are configured to form a second position characterized in that the tips separate to manipulate particles on a surface of a sample. The tips can be configured to form the first position when a voltage is applied across the tips, and preferable extend downwardly from the cantilever substantially perpendicular thereto.
摘要翻译： 一种用于操纵样品表面的方法和装置，包括悬臂，安装在悬臂上的第一尖端和安装在悬臂上的第二尖端，第一和第二尖端构造成组合以形成成像探针并分离 以形成操纵探针。 第一和第二尖端被配置成形成第一位置，其特征在于，所述尖端组合以形成成像尖端，并且所述第一和第二末端被配置成形成第二位置，其特征在于，所述尖端分离以操纵颗粒在 一个样品。 当跨越尖端施加电压时，尖端可被配置成形成第一位置，并且优选地从基本垂直于其的悬臂向下延伸。
-
22.发明申请PIEZORESISTIVE CANTILEVER BASED NANOFLOW AND VISCOSITY SENSOR FOR MICROCHANNELS 审中-公开用于微通道的基于阻尼器的纳米和粘度传感器公开(公告)号：US20080011058A1
公开(公告)日：2008-01-17
申请号：US11688064
申请日：2007-03-19
申请人： Ratnesh Lal , Ami Chand , Arjan Quist , Dan Cohen
发明人： Ratnesh Lal , Ami Chand , Arjan Quist , Dan Cohen
IPC分类号： G01N11/10
CPC分类号： G01N29/022 , G01N29/032 , G01N2291/0256 , G01N2291/02818 , G01N2291/02836 , G01Q20/04 , G01Q30/14
摘要： This invention provides a sensor to measure physical and/or chemical properties of viscous fluids. The sensor is based on microfabricated piezoresistive cantilevers. Deflection of these cantilevers is read out using, e.g., a wheatstone bridge to amplify and convert the deflection into a voltage output. The cantilevers and/or tips attached thereto, can be chemically or physically modified using reagents specific to interact with analytes to be detected in the fluid. The cantilevers can be integrated in a microfluidic system for easy fluid handling and the ability to manage small quantities of fluids.
摘要翻译： 本发明提供一种用于测量粘性流体的物理和/或化学性质的传感器。 传感器基于微型压阻式悬臂梁。 使用例如惠斯通电桥来读出这些悬臂的偏转，以将偏转放大并转换成电压输出。 与其连接的悬臂和/或尖端可以使用特异性的试剂进行化学或物理修饰，以与要在流体中检测的分析物相互作用。 悬臂可以集成在微流体系统中，便于流体处理和管理少量流体的能力。
-
公开(公告)号：US07040147B2
公开(公告)日：2006-05-09
申请号：US11075019
申请日：2005-03-08
CPC分类号： G01Q70/16 , G01B5/28 , G01D5/26 , G01Q10/02 , G01Q10/04 , G01Q10/06 , G01Q70/02 , G01Q70/08 , G01Q80/00
摘要： A method and apparatus for manipulating the surface of a sample including a cantilever, a first tip mounted on the cantilever, and a second tip mounted on the cantilever, the first and the second tip being configured to combine to form an imaging probe and to separate to form a manipulation probe. The first and second tips are configured to form a first position characterized in that the tips combine to form an imaging tip and the first and the second tip are configured to form a second position characterized in that the tips separate to manipulate particles on a surface of a sample. The tips can be configured to form the first position when a voltage is applied across the tips, and preferable extend downwardly from the cantilever substantially perpendicular thereto.
-
24.发明申请Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby 失效制造用于表征扫描探针显微镜探针的尖端形状的结构的方法和由此制造的结构公开(公告)号：US20050252282A1
公开(公告)日：2005-11-17
申请号：US10844200
申请日：2004-05-12
申请人： Ami Chand , Nihat Okulan
发明人： Ami Chand , Nihat Okulan
CPC分类号： G01Q40/02
摘要： A characterizer for determining the shape of a probe tip for an atomic force microscope and methods of fabricating and using the characterizer. The characterizer includes a micromachined crystalline structure with opposed edges separated by a width suitable for characterizing a dimension of the probe tip. At least one of the opposed edges overhangs an undercut region of the micromachined crystalline structure by an overhang distance that is greater than one third of the width. The probe tip is scanned across the edges of the characterizer for shape determination. The characterizer is formed by serially deep reactive ion etching and anisotropic etching (100) single crystal silicon. The opposed edges may be oxidation sharpened for use in profiling a bottom surface of the probe tip.
摘要翻译： 用于确定原子力显微镜的探针尖端的形状的表征器以及制造和使用该表征器的方法。 表征器包括微加工的晶体结构，其具有由适合于表征探针尖端的尺寸的宽度分开的相对边缘。 相对的边缘中的至少一个通过超过宽度的三分之一的伸出距离伸出微加工结晶结构的底切区域。 探针尖端扫描在表征器的边缘以进行形状确定。 表征器通过串联深反应离子蚀刻和各向异性蚀刻（100）单晶硅形成。 相对的边缘可以被氧化锐化以用于对探针末端的底表面进行成形。
-
-
-
搜索结果
24 条记录 (耗时 0.026 秒)
