公开(公告)号：US20100012864A1

公开(公告)日：2010-01-21

申请号：US12175856

申请日：2008-07-18

Applicant: Gerald A. Smith

Inventor： Gerald A. Smith

IPC: G21F5/015

CPC classification number: H01J3/40 ,  G21K1/00 ,  H01J2237/06391

Abstract: A long-term antimatter storage device that may be energized by a low power magnetron and can function autonomously for hundreds of hours on the energy provided by batteries. An evacuated, cryogenic container is arranged with a source of positrons and a source of electrons positioned in capture relation to one another within the container so as to allow for the formation of a plurality of positronium atoms. A microwave resonator is located within the container forming a circularly polarized standing wave within which the plurality of positronium atoms rotate. Radioactive sources for small stores and low energy positron accelerators for large stores are used to efficiently fill the device with positronium in seconds to minutes. The device may also be arranged to provide for the extraction of positrons. A method for storing antimatter is also provided.

Abstract translation: 一种长期的反物质储存装置，可以由低功率磁控管激励，并可以自动运行电池提供的能量上百小时。 真空的低温容器布置有正电子源和电子源，在容器内彼此捕获关系，以允许形成多个正电子原子。 微波谐振器位于容器内，形成圆偏振的驻波，多个正电子原子在其中旋转。 用于小商店的放射源和大型商店的低能量正电子加速器用于在数分钟至数分钟内用正电子体高效填充装置。 该装置还可以被布置成提供正电子的提取。 还提供了一种存储反物质的方法。

公开(公告)号：US07420166B2

公开(公告)日：2008-09-02

申请号：US10890723

申请日：2004-07-14

Applicant: Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

Inventor： Pranab Sabitru Naik ,  Christopher David Beling ,  Stevenson H. Y. Fung

IPC: G01N23/00

CPC classification number: H01J37/256 ,  H01J2237/06391

Abstract: Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations in bulk-materials as well as thin-films. The system is also useful in locating top surface metallizations and structures in solid state devices. This imaging system operates by scanning the sample surface with either a small positron source (22Na) or a focused positron beam. The system also possesses another two major parts, namely electronic instrumentation and stand-alone imaging software. In the system, the processing time and use of system resources are constantly monitored and optimized for producing high resolution S-parameter image of the sample in real time with a general purpose personal computer. The system software possesses special features with its embedded specialized algorithms and techniques that provide the user with adequate freedom for analyzing various aspects of the image in order to obtain a clear inference of the defect profile while at the same time keeping automatic track on the instrumentation and hardware settings. The system is useful for semiconductor and metal samples, giving excellent quality images of the subsurface defect profile and has applications for biological samples.

Abstract translation: 公开了一种能够产生高质量实时S参数图像的全自动系统。 它是材料科学和固态技术中有用和通用的工具，用于确定散装材料以及薄膜中地下缺陷类型和浓度的位置。 该系统还可用于固定固态器件中的顶表面金属化和结构。 该成像系统通过用小的正电子源（Na +）或聚焦的正电子束扫描样品表面来进行操作。 该系统还具有电子仪器和独立成像软件两个主要部分。 在系统中，不断监控和优化系统资源的处理时间和使用情况，以便用通用个人计算机实时生成样本的高分辨率S参数图像。 系统软件具有其嵌入式专用算法和技术的特殊功能，为用户提供了足够的自由度来分析图像的各个方面，以便获得缺陷轮廓的清晰推断，同时保持对仪器的自动跟踪， 硬件设置。 该系统对于半导体和金属样品是有用的，提供了优质的地下缺陷图像，并且具有生物样品的应用。

公开(公告)号：US20060011831A1

公开(公告)日：2006-01-19

申请号：US10890723

申请日：2004-07-14

Applicant: Pranab Naik ,  Christopher Beling ,  Stevenson Fung

Inventor： Pranab Naik ,  Christopher Beling ,  Stevenson Fung

IPC: H01J37/256 ,  G01N23/22

CPC classification number: H01J37/256 ,  H01J2237/06391

Abstract: Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations in bulk-materials as well as thin-films. The system is also useful in locating top surface metallizations and structures in solid state devices. This imaging system operates by scanning the sample surface with either a small positron source (22Na) or a focused positron beam. The system also possesses another two major parts, namely electronic instrumentation and stand-alone imaging software. In the system, the processing time and use of system resources are constantly monitored and optimized for producing high resolution S-parameter image of the sample in real time with a general purpose personal computer. The system software possesses special features with its embedded specialized algorithms and techniques that provide the user with adequate freedom for analyzing various aspects of the image in order to obtain a clear inference of the defect profile while at the same time keeping automatic track on the instrumentation and hardware settings. The system is useful for semiconductor and metal samples, giving excellent quality images of the subsurface defect profile and has applications for biological samples.

Abstract translation: 公开了一种能够产生高质量实时S参数图像的全自动系统。 它是材料科学和固态技术中有用和通用的工具，用于确定散装材料以及薄膜中地下缺陷类型和浓度的位置。 该系统还可用于固定固态器件中的顶表面金属化和结构。 该成像系统通过用小的正电子源（Na +）或聚焦的正电子束扫描样品表面来进行操作。 该系统还具有电子仪器和独立成像软件两个主要部分。 在系统中，不断监控和优化系统资源的处理时间和使用情况，以便用通用个人计算机实时生成样本的高分辨率S参数图像。 系统软件具有其嵌入式专用算法和技术的特殊功能，为用户提供了足够的自由度来分析图像的各个方面，以便获得缺陷轮廓的清晰推断，同时保持对仪器的自动跟踪， 硬件设置。 该系统对于半导体和金属样品是有用的，提供了优质的地下缺陷图像，并且具有生物样品的应用。