VEHICLE INSPECTION SYSTEM
    11.
    发明申请
    VEHICLE INSPECTION SYSTEM 审中-公开
    车辆检验系统

    公开(公告)号:US20160054470A1

    公开(公告)日:2016-02-25

    申请号:US14582097

    申请日:2014-12-23

    CPC classification number: G01V5/0016 B65G15/44 B65G17/08 B65G47/66 F16M13/02

    Abstract: The present invention discloses a vehicle inspection system, comprising: an inspection passage; a vehicle dragging system arranged in the inspection passage, wherein the vehicle dragging system comprises a first dragging means and a second dragging means, which are sequentially arranged along a vehicle dragging direction, and in the vehicle dragging direction, the first dragging means is arranged at the upstream of the second dragging means, and a separating section is arranged between the first dragging means and the second dragging means, so that the first dragging means and the second dragging means are separated by a preset distance in the vehicle dragging direction; and a radiographic inspection system, wherein at least a part of paths of the beams of the radiographic inspection system passes through the separating section between the first dragging means and the second dragging means.

    Abstract translation: 本发明公开了一种车辆检查系统,包括:检查通道; 布置在所述检查通道中的车辆牵引系统,其中所述车辆牵引系统包括沿着车辆拖动方向依次布置的第一牵引装置和第二牵引装置,并且在所述车辆拖动方向上,所述第一牵引装置布置在 第二牵引装置的上游和第一牵引装置和第二牵引装置之间设置分离部分,使得第一牵引装置和第二牵引装置在车辆拖动方向上分开预定的距离; 以及射线照相检查系统,其中所述射线照相检查系统的光束的至少一部分路径通过所述第一拖动装置和所述第二拖动装置之间的分离部分。

    X-RAY FLUOROSCOPIC IMAGING SYSTEM
    12.
    发明申请
    X-RAY FLUOROSCOPIC IMAGING SYSTEM 有权
    X射线荧光成像系统

    公开(公告)号:US20150185166A1

    公开(公告)日:2015-07-02

    申请号:US14582069

    申请日:2014-12-23

    Abstract: The X-ray fluoroscopic imaging system of the present invention comprises: an inspection passage; an electron accelerator; a shielding collimator apparatus comprising a shielding structure, and a first collimator for extracting a low energy planar sector X-ray beam and a second collimator for extracting a high energy planar sector X-ray beam which are disposed within the shielding structure; a low energy detector array for receiving the X-ray beam from the first collimator; and a high energy detector array for receiving the X-ray beam from the second collimator. The first collimator, the low energy detector array and the target point bombarded by the electron beam are located in a first plane; and the second collimator, the high energy detector array and the target point bombarded by the electron beam are located in a second plane.

    Abstract translation: 本发明的X射线透视成像系统包括:检查通道; 电子加速器; 包括屏蔽结构的屏蔽准直器装置和用于提取低能平面扇形X射线束的第一准直器和用于提取设置在屏蔽结构内的高能平面扇形X射线束的第二准直器; 低能量检测器阵列,用于接收来自第一准直仪的X射线束; 以及用于从第二准直器接收X射线束的高能量检测器阵列。 第一准直器,低能量检测器阵列和由电子束轰击的目标点位于第一平面中; 并且第二准直器,高能量检测器阵列和由电子束轰击的目标点位于第二平面中。

    SMART AUTOMATIC FREQUENCY CONTROL APPARATUS BASED ON DIGITAL CONTROL

    公开(公告)号:US20210364620A1

    公开(公告)日:2021-11-25

    申请号:US17256851

    申请日:2019-06-06

    Abstract: The present disclosure provides a smart automatic frequency control (AFC) apparatus, including: a phase shift module, connected to a first signal input terminal and configured to: receive an incident wave from the first signal input terminal, perform a phase shift on the incident wave according to a phase shift parameter so as to generate a phase-shifted signal, and output the phase-shifted signal to a phase detection module; and the phase detection module, connected to the phase shift module and a second signal input terminal and configured to: receive a reflected wave from the second signal input terminal, perform a phase detection on the phase-shifted signal and the reflected wave so as to generate a phase difference signal, and output the phase difference signal via a control interface.

    INSPECTION SYSTEM AND METHOD
    16.
    发明公开

    公开(公告)号:US20240319114A1

    公开(公告)日:2024-09-26

    申请号:US18574756

    申请日:2022-07-01

    Abstract: An inspection system includes: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on an inspected object; and a processor in communication connection with the radiation source and configured to select a periodic radiation combination corresponding to a type of the object according to the type of the object, and cause the radiation source to emit radiation to the object in the selected periodic radiation combination during the time that the object is scanned, and the periodic radiation combination is a chronological arrangement of radiation pulses output by the radiation source in each scanning period, and radiation pulses have at least two different radiation energies. The system is capable of improving adaptability and simplifying control. An inspection method is also provided.

    INSPECTION SYSTEM AND METHOD
    17.
    发明公开

    公开(公告)号:US20240302299A1

    公开(公告)日:2024-09-12

    申请号:US18575301

    申请日:2022-07-01

    CPC classification number: G01N23/083 G01N23/04 G01N2223/20 H01J25/50

    Abstract: An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select periodic radiation combinations respectively corresponding to at least two different portions of the object in the at least one periodic radiation combination, and cause the radiation source to emit radiation to the at least two corresponding different portions in selected periodic radiation combinations during the time that the object is scanned, wherein a periodic radiation combination is a chronological arrangement of at least one radiation pulse output by the radiation source in each scanning period. An inspection method is also provided.

    INSPECTION SYSTEM AND METHOD
    18.
    发明公开

    公开(公告)号:US20240319112A1

    公开(公告)日:2024-09-26

    申请号:US18575288

    申请日:2022-07-01

    CPC classification number: G01N23/02 G01N2223/1006 G01N2223/206 G01N2223/64

    Abstract: The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.

    BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM

    公开(公告)号:US20230288350A1

    公开(公告)日:2023-09-14

    申请号:US18013555

    申请日:2021-07-02

    Abstract: The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.

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