-
公开(公告)号:US11984297B2
公开(公告)日:2024-05-14
申请号:US17711181
申请日:2022-04-01
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sejin Oh , Youngdo Kim , Sanghun Kim , Sungyeol Kim , Younghwan Kim , Taemin Earmme , Changyun Lee , Sunghun Jang
IPC: H01J37/32 , H01L21/311
CPC classification number: H01J37/32183 , H01J37/32165 , H01J37/32568 , H01L21/31116 , H01J2237/334
Abstract: A plasma control device includes a matching circuit, a resonance circuit, and a controller. The matching circuit is connected to a first electrode of a plasma chamber including the first electrode and a second electrode, and matches impedance of a radio frequency (RF) power by an RF driving signal with an impedance of the first electrode. The RF driving signal is based on a first RF signal having a first frequency. The resonance circuit is connected between the second electrode and a ground voltage, and controls plasma distribution within the plasma chamber by providing resonance with respect to harmonics associated with the first frequency and by adjusting a ground impedance between the second electrode and the ground voltage. The controller provides the resonance circuit with a capacitance control signal associated with the resonance and switch control signals associated with the ground impedance.
-
公开(公告)号:US11150551B2
公开(公告)日:2021-10-19
申请号:US16855083
申请日:2020-04-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungsuk Oh , Joobyoung Kim , Sanghun Kim , Guk Hyun Kim
IPC: G06F30/392 , G03F1/36
Abstract: A computer-readable medium includes a program code that, when executed by a processing circuitry, causes the processing circuitry to divide a layout of a semiconductor chip into a plurality of patches, generate a plurality of segments from a layout of each of the plurality of patches, wherein a first patch of the plurality of patches includes first segments and a second patch of the plurality of patches includes second segments, calculate hash values respectively corresponding to the first segments and the second segments by using a hash function, calculate bias values of segments having a first hash value from among the first segments, calculate a representative value based on the bias values, and apply the representative value to the segments having the first hash value from among the first segments.
-