公开(公告)号：US20210203071A1

公开(公告)日：2021-07-01

申请号：US17017133

申请日：2020-09-10

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Young Ki LEE ,  Sun Woo LEE ,  Dooseok CHOI

IPC: H01Q5/35 ,  H01Q1/48 ,  H01Q1/24 ,  H01Q1/52

Abstract: An antenna includes a first dielectric substrate and a first feeding element. The first dielectric substrate includes a first insulating layer, and a first radiation plate including a first opening that exposes an upper surface of the first insulating layer. The first feeding element is disposed in the first opening to penetrate the first insulating layer in a direction extending toward a lower surface of the first dielectric substrate. The first feeding element is insulated from the first radiation plate by the first insulating layer. The first feeding element includes a first conductive plate having an upper surface located on a same plane as an upper surface of the first radiation plate.

公开(公告)号：US20190319717A1

公开(公告)日：2019-10-17

申请号：US16356088

申请日：2019-03-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dooseok CHOI ,  Dae-young YOON ,  Sun-woo LEE ,  Thomas Byunghak CHO ,  Seung-chan HEO

IPC: H04B17/00 ,  H03F3/24 ,  G01R29/08 ,  H04B1/44

Abstract: A method of testing a radio frequency (RF) integrated circuit includes: forming, performed by the RF integrated circuit, a test loop that passes through a first transceiver circuit, a first front-end circuit, and a second transceiver circuit, based on a test control signal transmitted from a test device; adjusting, performed by the RF integrated circuit, a shift degree of at least one phase shifter in the first front-end circuit, based on the test control circuit; and receiving, performed by the RF integrated circuit, a test input signal via the first transceiver circuit from the test device, and outputting, to the test device, the test input signal that has passed through the test loop, wherein the test input signal is output as a test output signal via the second transceiver circuit.