公开(公告)号：US20220343921A1

公开(公告)日：2022-10-27

申请号：US17861389

申请日：2022-07-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jaehoon JEONG ,  Sukanya SONOWAL ,  Kyuchun HAN ,  Shinjae KANG ,  Sangho LEE

IPC: G10L17/22 ,  G10L17/04 ,  G06F21/32

Abstract: An electronic device according to various embodiments of the disclosure may include: a microphone, at least one sensor, a memory storing a speaker verification model for verifying a voice of a registered user, and at least one processor operatively connected to the microphone, the at least one sensor, and the memory, wherein the at least one processor is configured to: identify whether user verification information is received through the at least one sensor within a designated time interval before or after a time point at which an uttered voice is received based on receiving the uttered voice through the microphone, and updates the speaker verification model using the uttered voice based on the user verification being completed according to the user verification information.

公开(公告)号：US20210055968A1

公开(公告)日：2021-02-25

申请号：US16998284

申请日：2020-08-20

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Changhyeon CHAE ,  Jusun SONG ,  Jaehoon JEONG ,  Jihun JUNG ,  Jaeook KWON ,  Seokjae JEONG ,  Youngho CHOI ,  Cheulhee HAHM

IPC: G06F9/50 ,  G06F9/48

Abstract: An electronic apparatus includes: a memory; a storage; and a processor, wherein: the electronic apparatus is configured to execute a plurality of processes as data of the plurality of processes is loaded into the memory based on execution of at least one program stored in the storage, the processor is configured to: identify a function currently running among a plurality of functions providable by the electronic apparatus, and based on a relationship between the plurality of processes and the identified function, terminate at least one process among the plurality of running processes, and allow a storage area of the memory loaded with the data of the terminated process to be available for another process.

公开(公告)号：US20210004272A1

公开(公告)日：2021-01-07

申请号：US16977288

申请日：2019-03-05

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Pyoungju HWANG ,  Chungki WOO ,  Seokjae JEONG ,  Jaehoon JEONG ,  Jihun JUNG

IPC: G06F9/50

Abstract: An electronic apparatus includes a memory; and a processor that executes a process based on data loaded into the memory, checks a current operating load level of the electronic apparatus, and executes any one operation corresponding to the checked current operating load level of the electronic apparatus among a first memory recovery operation of increasing an available capacity of the memory and a second memory recovery operation having a memory recovery rate different from that of the first memory recovery operation.

公开(公告)号：US20170213842A1

公开(公告)日：2017-07-27

申请号：US15067855

申请日：2016-03-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Min-chul PARK ,  Bio KIM ,  Young-Gu KIM ,  Jaehoon JEONG ,  Eunsuk CHO ,  Hyejin CHO ,  Jong In YUN

IPC: H01L27/115 ,  H01L29/06 ,  H01L21/02 ,  H01L29/10 ,  H01L21/28

CPC classification number: H01L27/11582 ,  H01L21/02164 ,  H01L21/02238 ,  H01L28/00 ,  H01L29/0649 ,  H01L29/1037 ,  H01L29/40117

Abstract: A semiconductor memory device includes a substrate, a stack disposed on the substrate, a vertical channel structure penetrating the stack, and a fixed charge layer disposed in the vertical channel structure. The stack includes insulating patterns and gate electrodes alternately and repeatedly disposed on one another. The vertical channel structure includes a data storing pattern.

公开(公告)号：US20240402619A1

公开(公告)日：2024-12-05

申请号：US18404626

申请日：2024-01-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Minkyu KIM ,  QHwan KIM ,  Ami MA ,  Sunghee LEE ,  Kyu-Baik CHANG ,  Jaehoon JEONG ,  Wanju CHO ,  Hanlim CHOI

IPC: G03F7/00

Abstract: An apparatus for predicting a structure of a semiconductor device, the apparatus includes: at least one processor; a storage configured to store a learned model configured to predict the structure of the semiconductor device; and a memory configured to store at least one code, and at least one processor operatively connected to the memory and configured to execute the at least one code to: input non-destructive metrology data measured from the semiconductor device into the learned model, and predict the structure of the semiconductor device, based on the learned model, wherein the learned model is trained with training data including first data which is non-destructive metrology data and second data which is structural metrology data as reference data of the first data, and wherein the training data is refined based on a similarity of the training data in a space having a first axis corresponding to the first data and a second axis corresponding to the second data as reference axes.

公开(公告)号：US20210110825A1

公开(公告)日：2021-04-15

申请号：US17067903

申请日：2020-10-12

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jaehoon JEONG ,  Sukanya SONOWAL ,  Daewoong SONG ,  Shinjae KANG ,  Junseok OH ,  Sangho LEE

IPC: G10L15/22 ,  G06F9/4401 ,  G06N3/08

Abstract: In accordance with an aspect of the disclosure, an electronic device comprises a first audio receiving circuit; a communication circuit; at least one processor operatively connected to the first audio receiving circuit and the communication circuit; and a memory operatively connected to the at least one processor, wherein the memory stores one or more instructions that, when executed, cause the at least one processor to: obtain first audio data, wherein the first audio data is based on a user utterance recorded by an external electronic device, through the communication circuit; convert the first audio data into second audio data, using a first transfer function of the first audio receiving circuit; and generate a wakeup model using the second audio data, the wakeup model configured to verify a wakeup word associated with the first audio data.