公开(公告)号：US20250094112A1

公开(公告)日：2025-03-20

申请号：US18798178

申请日：2024-08-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dongho LEE ,  Nakwon Choi ,  Bumho Chun

IPC: G06F3/14 ,  G06F1/16 ,  G06F3/04845

Abstract: A display apparatus and a method for controlling thereof are provided. The display apparatus includes: at least one processor configured to: obtain a content image, obtain, based on an external display apparatus being connected to a display apparatus through a hinge device, a first content image and a remaining portion of the content image, wherein the first content image is identified based on a resolution of the display apparatus, control the display to display the first content image, provide the second content image to the external display apparatus, and adjust, based on an angle between the display apparatus and the external display apparatus changing while displaying the first content image, a size of the second content image provided to the external display apparatus according to the angle while maintaining a size of the first content image.

公开(公告)号：US20240077535A1

公开(公告)日：2024-03-07

申请号：US18300870

申请日：2023-04-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Soonil KWON ,  Seongseob SHIN ,  Dongho LEE

IPC: G01R31/319 ,  G01R31/28

CPC classification number: G01R31/31924 ,  G01R31/2834 ,  G01R31/31905

Abstract: Disclosed is a test board which includes a substrate that includes a device under test (DUT) placement area where a first DUT and a second DUT are disposed, a first load switch connected in series with the first DUT and configured to be set to a switch on state or a switch off state based on a first enable signal, a second load switch connected in series with the second DUT and configured to be set to the switch on state or the switch off state depending on a second enable signal, and a test controller. The test controller may be configured to perform a test operation in a (1-1)-th mode by activating the first enable signal and deactivating the second enable signal and then perform the test operation in a (1-2)-th mode by deactivating the first enable signal and activating the second enable signal.

公开(公告)号：US20220365132A1

公开(公告)日：2022-11-17

申请号：US17549005

申请日：2021-12-13

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kijae SONG ,  Jongkook KIM ,  Dongho LEE ,  Seonmi LEE

IPC: G01R31/28 ,  G01R1/04

Abstract: A test board for testing a semiconductor apparatus includes a first board configured to support a plurality of first Devices Under Test (DUTs) such that the plurality of first DUTs are mounted on the first board, a plurality of first inter-board connectors arranged on the first board, and a plurality of second boards stacked on the first board through the plurality of first inter-board connectors, each second board of the plurality of second boards having a surface configured to support a separate second DUT of a plurality of second DUTs such that the plurality of second DUTs are mounted on separate, respective second boards of the plurality of second board.

公开(公告)号：US20210318061A1

公开(公告)日：2021-10-14

申请号：US16950744

申请日：2020-11-17

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dongho LEE ,  Youngil SONG ,  Jisu RHIE

IPC: F25D29/00 ,  F25D23/02

Abstract: The refrigerator includes a door including a door body and a front panel coupled to a front surface of the door so to cover a front surface of the door body. The front panel includes a display including a screen on which an image is displayed, and a glass panel provided in front of the display. The glass panel includes a glass member and a decorative layer formed in an area other than an area corresponding to the screen of the display among an entire area of the glass member. The front panel includes a support plate coupled to the glass panel and including a display mounting portion on which the display is mounted.