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公开(公告)号：US20160327219A1
公开(公告)日：2016-11-10
申请号：US15214837
申请日：2016-07-20
Inventor： AKIRA HASHIYA , TAKU HIRASAWA , YASUHISA INADA , YOSHITAKA NAKAMURA , MITSURU NITTA , TAKEYUKI YAMAKI
CPC classification number: F21K9/64 , F21S2/00 , G02B5/1809 , G02B5/1861 , G02B6/00 , H01L33/505 , H01L33/508 , H01L33/58
Abstract: A light-emitting apparatus includes a light-emitting device and an excitation light source. The light-emitting device includes a photoluminescent layer, a light-transmissive layer. At least one of the photoluminescent layer and the light-transmissive layer has a submicron structure having at least projections or recesses. Light emitted from the photoluminescent layer includes first light having a wavelength λa in air. The distance Dint between adjacent projections or recesses and the refractive index nwav-a of the photoluminescent layer for the first light satisfy λa/nwav-a
Abstract translation: 发光装置包括发光装置和激发光源。 发光器件包括光致发光层，透光层。 光致发光层和透光层中的至少一个具有至少具有突起或凹陷的亚微米结构。 从光致发光层发射的光包括在空气中具有波长λa的第一光。 相邻的凸部或凹部之间的距离Dint以及第一光的光致发光层的折射率nwav-a满足λa/ nwav-a
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公开(公告)号：US20150249187A1
公开(公告)日：2015-09-03
申请号：US14621729
申请日：2015-02-13
Inventor： YASUHISA INADA , TAKU HIRASAWA , YOSHITAKA NAKAMURA , AKIRA HASHIYA , MITSURU NITTA , TAKEYUKI YAMAKI
CPC classification number: G02B6/1225 , G02B6/124 , H01L2933/0083
Abstract: A light-emitting device includes a photoluminescent layer that emits light containing first light, a light-transmissive layer located on or near the photoluminescent layer, a low-refractive-index layer and a high-refractive-index layer. A submicron structure is defined on the photoluminescent layer and/or the light-transmissive layer. The low-refractive-index layer is located on or near the photoluminescent layer so that the photoluminescent layer is located between the low-refractive-index layer and light-transmissive layer. The high-refractive-index layer is located on or near the low-refractive-index layer so that the low-refractive-index layer is located between the high-refractive-index layer and the photoluminescent layer. The submicron structure includes at least projections or recesses and satisfies the following relationship: λa/nwav-a
Abstract translation: 发光装置包括发射含有第一光的光的光致发光层，位于光致发光层上或附近的透光层，低折射率层和高折射率层。 亚微米结构限定在光致发光层和/或透光层上。 低折射率层位于光致发光层上或附近，使得光致发光层位于低折射率层和透光层之间。 高折射率层位于低折射率层上或附近，使得低折射率层位于高折射率层和光致发光层之间。 亚微米结构至少包括凸起或凹槽，并且满足以下关系：λa/ nwav-a
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公开(公告)号：US20150249183A1
公开(公告)日：2015-09-03
申请号：US14618254
申请日：2015-02-10
Inventor： TAKU HIRASAWA , YASUHISA INADA , YOSHITAKA NAKAMURA , AKIRA HASHIYA , MITSURU NITTA , TAKEYUKI YAMAKI
CPC classification number: C09K11/00 , C09K11/7721 , H01L33/508 , H05B33/14
Abstract: A light-emitting device includes a photoluminescent layer that emits light containing first light, a light-transmissive layer located on or near the photoluminescent layer, and one or more reflectors. A submicron structure is defined on at least one of the photoluminescent layer and the light-transmissive layer. The one or more reflector are located outside the submicron structure. The submicron structure includes at least projections or recesses and satisfies the following relationship: λa/nwav-a
Abstract translation: 发光装置包括发射含有第一光的光的光致发光层，位于光致发光层上或附近的透光层，以及一个或多个反射器。 亚微米结构限定在光致发光层和透光层中的至少一个上。 一个或多个反射器位于亚微米结构之外。 亚微米结构至少包括凸起或凹槽，并且满足以下关系：λa/ nwav-a
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公开(公告)号：US20150171373A1
公开(公告)日：2015-06-18
申请号：US14560702
申请日：2014-12-04
Inventor： TAKU HIRASAWA , YASUHISA INADA , AKIRA HASHIYA , YOSHITAKA NAKAMURA
CPC classification number: H01L51/5268 , G02B5/0252 , G02B5/1809 , G02B5/1866 , G02F1/133606 , H01L51/5275
Abstract: An optical sheet includes a light scattering layer that scatters at least a part of light incident thereon by diffraction and that includes first and second areas. Each first area is a projection. Each second area is a recess. Each of at least the projections or the recesses has a tapered shape. When a center wavelength of the light incident on the light scattering layer is λ and a refractive index of a layer that is in contact with the light scattering layer at a light emission side is n, spatial frequency components of a pattern formed by the first and second areas have a maximum peak at a spatial frequency in a range of 0.068/(λ×n) or more and 2.8/(λ×n) or less.
Abstract translation: 光学片包括光散射层，其散射通过衍射入射到其上的光的至少一部分，并且包括第一和第二区域。 每个第一个区域都是一个投影。 每个第二个区域都是一个凹槽。 至少突起或凹部中的每一个具有锥形形状。 当入射到光散射层上的光的中心波长为λ，并且在光出射侧与光散射层接触的层的折射率为n时，由第一和第 第二区域在0.068 /（λ×n）以上且2.8 /（λ×n）以下的范围内的空间频率具有最大峰值。
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公开(公告)号：US20250044427A1
公开(公告)日：2025-02-06
申请号：US18919484
申请日：2024-10-18
Inventor： YASUHISA INADA , AKIRA HASHIYA , YUMIKO KATO
IPC: G01S7/4911 , G01S7/48 , G01S7/481 , G01S7/4914 , G01S17/42 , G01S17/89
Abstract: A distance measuring apparatus includes a light source that emits a light beam, a scanning device that performs beam scanning where an emission direction of the light beam is changed, a photodetector that receives light reflected from measurement points on a target irradiated with the light beam and that outputs detection signals, a processing circuit that calculates distances to the measurement points on a basis of the detection signals, and a control circuit that controls the scanning device. The control circuit determines a step angle of the beam scanning in such a way as to reduce differences in density of the measurement points between areas of the target.
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Patent Agency Ranking
公开(公告)号：US20250035434A1
公开(公告)日：2025-01-30
申请号：US18916777
申请日：2024-10-16
Inventor： AKIRA HASHIYA , YASUHISA INADA
IPC: G01B11/30
Abstract: A measurement system includes a light source, an optical detector, and a processing circuit. The light source emits irradiation light to be applied to multiple measurement points included in at least one evaluation region of a surface of an object. The optical detector receives reflected light returned from the multiple measurement points and outputs a detection signal. The processing circuit calculates and outputs a roughness parameter regarding an uneven shape of the at least one evaluation region, based on the detection signal. The processing circuit corrects the roughness parameter in accordance with an angle of incidence of the irradiation light incident on the at least one evaluation region, a measurement distance in the at least one evaluation region, or intensity of received light obtained as a result of the at least one evaluation region being irradiated with the irradiation light.
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公开(公告)号：US20200379314A1
公开(公告)日：2020-12-03
申请号：US16994758
申请日：2020-08-17
Inventor： AKIRA HASHIYA , YASUHISA INADA , TAKU HIRASAWA
IPC: G02F1/295
Abstract: An optical device includes: a first multilayer reflective film mirror; a second multilayer reflective film mirror facing the first multilayer reflective film mirror; an optical waveguide layer that is located between the first and second multilayer reflective film mirrors and propagates light whose wavelength in a vacuum is λ; and a first transparent electrode layer located at at least one position of a position between the first multilayer reflective film mirror and the optical waveguide layer, a position between the second multilayer reflective film mirror and the optical waveguide layer, a position between two adjacent layers included in the first multilayer reflective film mirror, and a position between two adjacent layers included in the second multilayer reflective film mirror. The transmittance of the first multilayer reflective film mirror for the light is higher than the transmittance of the second multilayer reflective film mirror for the light.
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公开(公告)号：US20200333588A1
公开(公告)日：2020-10-22
申请号：US16901760
申请日：2020-06-15
Inventor： YASUHISA INADA , AKIRA HASHIYA , TAKU HIRASAWA
Abstract: An optical scanning device includes: a first mirror; a second mirror opposed to the first mirror; two non-waveguide regions sandwiched between the first mirror and the second mirror; an optical waveguide region disposed between the two non-waveguide regions; and two intermediate regions. The average refractive index of the optical waveguide region is higher than the average refractive index of each intermediate region. The average refractive index of each intermediate region is higher than the average refractive index of each non-waveguide region. The first mirror allows part of light propagating through the optical waveguide region to be emitted as emission light in a third direction. By changing the refractive index and/or thickness of the optical waveguide region, the third direction, which is the emission direction of the emission light, is changed.
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公开(公告)号：US20170284609A1
公开(公告)日：2017-10-05
申请号：US15446453
申请日：2017-03-01
Inventor： TAKU HIRASAWA , YASUHISA INADA , AKIRA HASHIYA
CPC classification number: F21K9/64 , F21V9/14 , F21V9/30 , F21Y2115/10 , H01L33/505 , H01L33/507 , H01L33/508 , H01L33/54 , H01L33/58
Abstract: A light-emitting device comprises a layered structure between a first layer and a second layer. The first first layer has a refractive index n1 for first light having a wavelength λa in air. The second layer has a refractive index n2 for the first light. The layered structure comprises: a photoluminescent layer having a first surface facing the first layer and a second surface facing the second layer; and a surface structure disposed on at least one selected from the group consisting of the first surface and the second surface of the photoluminescent layer. The refractive index n1 and the refractive index n2 are lower than a refractive index nwav-a of the photoluminescent layer for the first light. The layered structure has an effective thickness to more strongly emit TE polarized light than TM polarized light.
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20.发明申请LIGHT-EMITTING DEVICE HAVING SURFACE STRUCTURE FOR LIMITING DIRECTIONAL ANGLE OF LIGHT 有权具有限定方向角度的表面结构的发光装置公开(公告)号：US20170054060A1
公开(公告)日：2017-02-23
申请号：US15216669
申请日：2016-07-21
Inventor： AKIRA HASHIYA , TAKU HIRASAWA , YASUHISA INADA
CPC classification number: H01L33/505 , H01L33/44 , H01L33/508
Abstract: A light-emitting device includes; a photoluminescent layer that emits light; and a light-transmissive layer on which the emitted light is to be incident. At least one of the photoluminescent layer and the light-transmissive layer defines a surface structure. The surface structure has projections and/or recesses to limit a directional angle of the emitted light. The photoluminescent layer and the light-transmissive layer are curved.
Abstract translation: 发光装置包括： 发光的光致发光层; 以及发射光入射到其上的透光层。 光致发光层和透光层中的至少一个限定了表面结构。 表面结构具有用于限制发射光的方向角的突起和/或凹部。 光致发光层和透光层是弯曲的。
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