公开(公告)号：US11841218B2

公开(公告)日：2023-12-12

申请号：US17377439

申请日：2021-07-16

Applicant: Shih-Yao Pan ,  Chih-Yao Ting ,  Chia-Hung Lin ,  Hsin-Yun Chang

Inventor： Shih-Yao Pan ,  Chih-Yao Ting ,  Chia-Hung Lin ,  Hsin-Yun Chang

IPC: G01B11/30

CPC classification number: G01B11/303

Abstract: Herein disclosed are a surface topography measuring system and a method thereof. The method comprises the following steps: dividing a test beam into a first sub-beam, entering a reflecting mirror along a first axis, and a second sub-beam, entering an object surface along a second axis; moving the reflecting mirror for reflecting the first sub-beam at different positions on the first axis to generate N reflected beams; generating an object reflected beam, related to the second sub-beam, reflected from the object surface; generating N images, related to the N reflected beams and the object reflected beam, and each of the N images having a plurality of interference fringes; analyzing the interference fringes in each of the N images to calculate N curve formulas; calculating a surface topography of the object surface from the N curve formulas.

公开(公告)号：US20230204659A1

公开(公告)日：2023-06-29

申请号：US17981167

申请日：2022-11-04

Applicant: CHROMA ATE INC.

Inventor： Chun-Lin WU ,  Kuo Wei HUANG

IPC: G01R31/28

CPC classification number: G01R31/2889

Abstract: A micro device under test (DUT) carrier includes a carrier main body, a pusher and a spring. The carrier main body includes a plurality of bearing stages. Each bearing stage is utilized to bear a micro DUT. The pusher, operated to move from a locking position to an opening position, includes a pusher main body and a plurality of locking elements. Each locking element corresponds to each bearing stage, and is located next to each bearing stage. The spring is utilized to send the pusher back to the locking position, so that each locking element restricts movement of each micro DUT.

公开(公告)号：US20230204260A1

公开(公告)日：2023-06-29

申请号：US17976906

申请日：2022-10-31

Applicant: CHROMA ATE INC.

Inventor： JIAN-HUNG LIN ,  SHAO-EN CHUNG

IPC: F25B13/00 ,  F25B39/04 ,  F28C3/08

CPC classification number: F25B13/00 ,  F25B39/04 ,  F28C3/08 ,  F25B19/005

Abstract: A heat exchange device and a cooling system are provided. The heat exchange device includes a low-pressure chamber and a high-pressure chamber disposed in the low-pressure chamber. The low-pressure chamber has a first wall for enabling heat exchange and an output portion in communication with the outside to output the low-pressure fluid. The high-pressure chamber has an input portion in communication with the outside to admit the high-pressure fluid and nozzles in communication with the low-pressure chamber. The fluid discharged from the nozzles undergoes a pressure drop and undergoes heat exchange through the first wall. Cooling capability is developed in the heat exchange device and works in the heat exchange device to thereby dispense with a pipeline which must be otherwise provided to link an expansion process and an evaporation process of the fluid and may otherwise cause cooling capability loss, so as to greatly enhance heat exchange capability and cooling efficiency.

公开(公告)号：US20230155497A1

公开(公告)日：2023-05-18

申请号：US18050060

申请日：2022-10-27

Applicant: CHROMA ATE INC.

Inventor： Chen Yuan WU ,  Chih Hsien WANG ,  Kuo Cheng WANG ,  Cheng Chung LEE

IPC: H02M3/139 ,  H02M3/158 ,  H02M3/157 ,  H02M1/00

CPC classification number: H02M3/139 ,  H02M1/0025 ,  H02M3/157 ,  H02M3/1582

Abstract: The present invention relates to an AC/DC power conversion module and a method of driving the same. When an AC/DC converter is electrically coupled to an external power source, a microprocessor is electrically energized by a buck auxiliary circuit, under control of the microprocessor, a DC/DC converter is activated for a certain time period, and then, the AC/DC converter is activated. Thereafter, an output voltage of the AC/DC converter is boosted, and an output voltage of the DC/DC converter is boosted accordingly. Power elements in the downstream side DC/DC converter are activated first, and then power elements in the upstream side AC/DC converter are activated, thereby an inrush current is suppressed. Once the external power source is connected, the buck auxiliary circuit will automatically reduce a voltage of the power input to activate the module. It realizes that the module will autonomously operate after being electrically energized.

公开(公告)号：US20230127994A1

公开(公告)日：2023-04-27

申请号：US17969207

申请日：2022-10-19

Applicant: CHROMA ATE INC.

Inventor： Po-Kai Cheng

IPC: H05K7/20

Abstract: An inlet module is adapted to be disposed on a housing of an electronic device, and includes an insert board and at least one adjusting plate. The insert board has a plurality of first air passages, at least one second air passage, and at least one positioning unit. The second air passage is located between two of the first air passages, and has an area larger than that of each first air passage. The adjusting plate has an opening having an area smaller than that of the second air passage. The adjusting plate is operable to be positioned at a position where the opening and the second air passage are overlapped with each other, thereby reducing an area of the airflow passing through the second air passage.

公开(公告)号：US11579170B2

公开(公告)日：2023-02-14

申请号：US17393724

申请日：2021-08-04

Applicant: CHROMA ATE INC.

Inventor： Chin-Yuan Chang ,  Chun-Hao Hu ,  Hsueh-Cheng Hsieh ,  Ming-Hui Chen

IPC: G01R1/067

Abstract: The present invention provides a probe apparatus, which comprises a signal transmission device, a probe, and a bottom fixing device. The signal transmission device includes a first transmission part and a second transmission part. An end of the probe is connected electrically below the second transmission part. The bottom fixing device is disposed below the signal transmission device. An end of the bottom fixing device includes a first penetrating hole and a first recess is disposed below the end. The probe passes through the first penetrating hole of the bottom fixing device. The probe is located in the first recess. The bottom fixing device reinforces the mechanical strength of the signal transmission device so that the width of the signal transmission device can be reduced. Thereby, the benefit of high-density arrangement of the probe apparatus can be achieved.

公开(公告)号：US20220209493A1

公开(公告)日：2022-06-30

申请号：US17536153

申请日：2021-11-29

Applicant: CHROMA ATE INC.

Inventor： Sheng-Hung WANG ,  Po-Hsiang CHANG

IPC: H01S5/00 ,  G01R31/26

Abstract: The present invention relates to a laser diode testing system and a laser diode testing method. The method comprises the steps of moving a laser bar or a plurality of laser diodes to a first test station by means of a first transfer device; then, electrically contacting each laser diode by a first probe module in sequence; measuring electrical and optical characteristics of the laser diodes electrically contacted by the first probe module sequentially by means of a first measuring device; moving the laser bar or the plurality of laser diodes out of the first test station by means of the first transfer device, wherein a magnetic field generated by an electromagnetic generating unit of an electromagnetic slide interacts with a magnetic field of a permanent magnet of the first transfer device, so that the first transfer device is driven and moved.

公开(公告)号：US20220206059A1

公开(公告)日：2022-06-30

申请号：US17551246

申请日：2021-12-15

Applicant: CHROMA ATE INC.

Inventor： Ming Cheng HUANG ,  Tsung-I LIN ,  Hui-Jung WU ,  Chien-Ming CHEN

IPC: G01R31/28 ,  G01R1/04

Abstract: The present invention relates to a low-thermal resistance pressing device for a socket, which mainly comprises a housing, an inner collar, a heat conductive pressing block, a bearing collar and a locking member. The locking member on the housing is used to lock the socket. The inner collar is threadedly engaged with the housing. The bearing collar is located between the inner collar and the heat conductive pressing block. In the case of rotating the inner collar in the housing, the bearing collar drives the heat conductive pressing block to move axially so as to exert an axial force to a device to be tested. Because the heat conductive pressing block protrudes from the upper and lower surfaces of the housing, one end thereof can be in contact with a temperature control module, and the other end thereof can be in contact with the device to be tested.

公开(公告)号：US11269170B2

公开(公告)日：2022-03-08

申请号：US16719386

申请日：2019-12-18

Applicant: CHROMA ATE INC.

Inventor： Shih-Yao Pan ,  Yu-Yen Wang ,  Tsung-Hsien Ou ,  Kuo-Wei Huang

IPC: G02B21/00 ,  G02B21/02 ,  G02B21/36

Abstract: A separate microscopy system, applied to observe a specimen positioned on a stage and further to image the specimen on an imaging device, includes an ocular-lens unit, an adjustment unit and an objective-lens unit. The ocular-lens unit has an ocular-lens optical axis, and is manipulated to make the ocular-lens optical axis perpendicular to the stage. The adjustment unit is assembled to a side of the ocular-lens unit close to the stage. The objective-lens unit has an objective-lens optical axis, and is assembled to a side of the adjustment unit close to the stage. The objective-lens unit is manipulated to be adjusted by the adjustment unit to make the ocular-lens optical axis, the objective-lens optical axis and the imaging device co-axially and perpendicular to the stage, such that the specimen can be imaged at an imaging center position of the imaging device. In addition, an adjusting method thereof is also provided.

公开(公告)号：US11169178B2

公开(公告)日：2021-11-09

申请号：US17023445

申请日：2020-09-17

Applicant: Chroma Ate Inc.

Inventor： Chin-Yi Ouyang ,  Chien-Ming Chen ,  Bo-An Su ,  Yu-Hsuen Wang

IPC: G01R1/04

Abstract: The present invention relates to a locking mechanism for a press head, and an electronic device testing apparatus comprising the same, wherein a slider and a locking pin are disposed on the press head and a test socket substrate, respectively. When the press head is moved and engaged with the test socket substrate, an actuator drives the slider to secure the locking pin, so as to secure the press head and the test socket substrate and prevent the press head and the test socket substrate from being separated from each other. The mechanism is simple in construction, easy to install and maintain, reliable, and can be integrated into the support arms, and occupies a relatively small space. Energy is consumed only when the actuator is actuated to effect locking or unlocking. That is, only when the slider is driven and moved, energy is consumed. No extra energy is needed to persistently press down or drive the locking mechanism.