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公开(公告)号:US5995646A
公开(公告)日:1999-11-30
申请号:US8570
申请日:1998-01-16
申请人: Yasuaki Yonezawa , Hiroo Arataki
发明人: Yasuaki Yonezawa , Hiroo Arataki
IPC分类号: B23Q7/14 , B23Q17/24 , G05B19/418 , G06K9/00
CPC分类号: G05B19/41835 , B23Q17/24 , B23Q7/1426 , G05B19/4183 , G05B2219/32127 , G05B2219/37556 , G05B2219/37572 , Y02P90/10 , Y02P90/12 , Y10S209/939
摘要: A work transportation line includes a work handling apparatus which has an operation that is automatically changed in response to alteration of a work type, from one type to another, so as to be suitable for a work type to which a subject work is altered. An indication of a work type alteration is provided as a result of a comparison between specified attributes of a subject work, which are extracted from a two-valued image of the subject work, and predetermined reference attributes for various work types.
摘要翻译: 工作运输线包括作业处理装置,其具有响应于工作类型的改变而自动地改变的操作,从一种到另一种,以适合于改变对象作品的作业类型。 作为工作类型变更的指示,作为从被检体作业的二值图像提取的被检体作品的指定属性与各种工作类型的预定基准属性之间的比较的结果来提供。
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公开(公告)号:US20090048699A1
公开(公告)日:2009-02-19
申请号:US12087719
申请日:2006-12-06
申请人: Dirk Jahn
发明人: Dirk Jahn
CPC分类号: G01B11/24 , G05B2219/37556 , G05B2219/37572 , G05B2219/50071
摘要: There is described a system and method for detecting a geometry of a workpiece for the purposes of processing the workpiece. In order to simplify optimization of a manufacturing strategy for processing a workpiece, the system has at least one camera for producing at least one image of the workpiece before a processing step, a memory area for desired geometry values the workpiece should have after the processing step, determination means for determining workpiece geometry values the workpiece has before the processing step on the basis of the at least one image, and calculating means for calculating differential geometry values describing a difference between the workpiece geometry values and the desired geometry values.
摘要翻译: 描述了为了处理工件的目的而检测工件的几何形状的系统和方法。 为了简化用于处理工件的制造策略的优化,该系统具有至少一个相机,用于在处理步骤之前产生工件的至少一个图像,在加工步骤之后,工件应具有所需几何值的存储区域 ,用于基于所述至少一个图像确定所述工件在所述加工步骤之前具有的工件几何值的确定装置;以及用于计算描述所述工件几何值和所述几何值之间的差异的微分几何值的计算装置。
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