公开(公告)号：US10783815B2

公开(公告)日：2020-09-22

申请号：US16307748

申请日：2018-09-12

Applicant: WUHAN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.

Inventor： Meihong Wang ,  Peiqian Tong

IPC: G09G3/00 ,  G01R31/28

Abstract: A testing apparatus and a testing method for a display panel. The testing apparatus includes a microcontroller unit (MCU) module; an electrical monitoring module, a power supply module, and a field programmable gate array (FPGA) module that are connected to the MCU module; a user interface (UI) display module; an optical monitoring module connected to the UI display module; and a gate driver on array (GOA) signal processing module and a digital-to-analog converter (DAC) module that are connected to the FPGA module. The power supply module, the GOA signal processing module, the DAC module, the electrical monitoring module, and the optical monitoring module are connected to a to-be-tested display panel.