公开(公告)号：US20160189948A1

公开(公告)日：2016-06-30

申请号：US14912413

申请日：2014-08-19

Applicant: UNIVERSITÄT INNSBRUCK

Inventor： Martin BREITENLECHNER ,  Armin HANSEL

IPC: H01J49/14 ,  H01J49/04

CPC classification number: H01J49/145 ,  H01J49/0422 ,  H01J49/063

Abstract: A device for analyzing a sample gas comprises an ion source for generating primary ions, a reaction chamber to which the primary ions produced in the ion source and the sample gas to be analyzed can be supplied in order to form product ions by chemical ionization of components in the sample gas, and an analyzer/detector unit for determining different types of ions. A reaction space in the reaction chamber, within which the primary ions supplied to the reaction chamber and the product ions produced are guided and which extends between a first end facing the ion source and a second end facing the analyzer/detector unit, is surrounded by at least two electrodes which are in the form of helices which wind round a common axis with identical pitches and are offset with respect to one another in the direction of the axis. An AC voltage is applied to each of the electrodes.

Abstract translation: 用于分析样品气体的装置包括用于产生一次离子的离子源，可以提供在离子源中产生的一次离子和待分析样品气体的反应室，以便通过化学电离组分形成产物离子 在样品气体中，以及用于确定不同类型离子的分析仪/检测器单元。 反应室中的反应空间被提供给反应室的初级离子和产生的产物离子被引导并且在面向离子源的第一端和面向分析器/检测器单元的第二端之间延伸的反应空间被 至少两个电极，其形式为螺旋形，其以相同的间距绕公共轴线旋转，并且在轴线方向上相对于彼此偏移。 AC电压被施加到每个电极。