公开(公告)号：US20240264194A1

公开(公告)日：2024-08-08

申请号：US18432494

申请日：2024-02-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yeontae Kim ,  Jinhee Park ,  Joengseok Kim ,  Jinseop Lee ,  Bongkyun Jin ,  Eunju Park ,  Eungsun Lee ,  Hyekyoung Moon ,  Hyangbong Lee ,  Hyunyul Park ,  Seoungkyo Yoo

IPC: G01N35/10 ,  G01N33/18 ,  G01N35/08

CPC classification number: G01N35/1095 ,  G01N33/1813 ,  G01N35/085 ,  G01N35/1016

Abstract: Provided is a contaminant analysis apparatus including a pretreatment sampler configured to collect and filter an effluent discharged through a discharge pipe to provide an analysis target sample, a sample introduction unit configured to receive the analysis target sample from the pretreatment sampler, a sample injection unit configured to selectively supply the analysis target sample supplied from the sample introduction unit, a sample analysis unit including an integrated analyzer configured to analyze ion components and heavy metal components of the analysis target sample which is supplied from the sample injection unit, and an analysis controller configured to control the sample introduction unit, the sample injection unit, and the sample analysis unit, wherein the sample introduction unit includes a first sample introduction unit including two or more first sample introduction unit syringe pumps and a second sample introduction unit including one or more second sample introduction unit syringe pumps.