公开(公告)号：US12148784B2

公开(公告)日：2024-11-19

申请号：US17393855

申请日：2021-08-04

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dae Shik Kim ,  Min-Sun Keel ,  Hoon Joo Na ,  Kang Ho Lee ,  Kil Ho Lee ,  Sang Kil Lee ,  Jung Hyuk Lee ,  Shin Hee Han

IPC: H01L21/768 ,  H01L27/146

Abstract: An image sensor including a variable resistance element is provided. The image sensor comprises first and second chips having first and second connecting structures; and a contact plug connecting the first and second chips. The first chip includes a photoelectric conversion element. The second chip includes a first variable resistance element. The contact plug extends from the first surface of the first semiconductor substrate to connect the first and second connecting structures.

公开(公告)号：US09377418B2

公开(公告)日：2016-06-28

申请号：US14132522

申请日：2013-12-18

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jong Ha Lee ,  Kang Ho Lee ,  Young Hun Sung ,  Sang Wook Han

IPC: G01N23/04 ,  A61B6/00 ,  H04N5/32

CPC classification number: G01N23/04 ,  A61B6/42 ,  A61B6/4233 ,  A61B6/502 ,  A61B6/54 ,  A61B6/544 ,  A61B6/545 ,  A61B6/585 ,  H04N5/32

Abstract: An X-ray imaging apparatus includes an X-ray generator configured to generate and radiate X-rays to a subject, an X-ray detector configured to detect and convert X-rays transmitted through the subject into an image signal, and a controller configured to analyze the image signal of the subject and set gain of the X-ray detector according to detection regions.

Abstract translation: 一种X射线成像装置，具备：X射线发生器，被配置为向被摄体生成X射线; X射线检测器，被配置为检测并将通过被摄体发送的X射线转换为图像信号，以及控制器配置 分析对象的图像信号，并根据检测区域设定X射线检测器的增益。

公开(公告)号：US11625188B2

公开(公告)日：2023-04-11

申请号：US17172299

申请日：2021-02-10

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jung Hyuk Lee ,  Hye Min Shin ,  Kang Ho Lee

IPC: G06F3/06 ,  G06F11/10

Abstract: A memory device includes a first nonvolatile memory including a resistive memory cell; and a controller. The controller may be configured to provide the first nonvolatile memory with a first data, a first program command, and a first address. The controller may be configured to receive a second data, which is a verify read from the resistive memory cell programmed with the first data, from the first nonvolatile memory in response to the first program command. The controller may be configured to compare the first data with the second data to detect a number of fail cells. When the number of detected fail cells is greater than a reference value, the controller may be configured to generate a third data obtained by inversing the first data, and provide the third data to the first nonvolatile memory. The first data may include an inversion flag bit.

公开(公告)号：US09700268B2

公开(公告)日：2017-07-11

申请号：US14513370

申请日：2014-10-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Dong Goo Kang ,  Hyun Hwa Oh ,  Sung Hoon Kang ,  Young Hun Sung ,  Kang Ho Lee

IPC: A61B6/00 ,  A61B6/04

CPC classification number: A61B6/4241 ,  A61B6/0414 ,  A61B6/482 ,  A61B6/5205 ,  A61B6/542

Abstract: An X-ray imaging apparatus and control method for the X-ray imaging apparatus are provided. The X-ray imaging apparatus includes an X-ray source configured to generate and emit X-rays having a preset broadband, an X-ray detector including a plurality of raw pixels configured to detect an average of ten photons or less in response to the X-rays which are emitted and convert the detected photons into an electrical signal, and an image processor configured to produce a plurality of single-energy images corresponding respectively to a plurality of preset energy bands by separating the plurality of raw pixels for each of the plurality of preset energy bands based on the electrical signal, and to produce a multi-energy image using the single-energy images.