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公开(公告)号:US20210278280A1
公开(公告)日:2021-09-09
申请号:US17111258
申请日:2020-12-03
Applicant: Samsung Display Co., Ltd.
Inventor: Su Hwan LEE , Young Bae KEE , Min Woo KIM , Un Cheol SUNG , Byoung Gu AN , Jae Soo HA
Abstract: A method for inspecting a nozzle includes: measuring a temperature of the nozzle; comparing the temperature of the nozzle with a reference temperature; and determining whether or not the nozzle is clogged based on the temperature of the nozzle.
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公开(公告)号:US20170125680A1
公开(公告)日:2017-05-04
申请号:US15175282
申请日:2016-06-07
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor: Su Hwan LEE , Eun Ho KIM
CPC classification number: H01L51/0012 , C23C14/00 , H01L51/0011 , H01L51/5237 , H01L51/56
Abstract: A deposition mask assembly includes a frame including a first opening portion and a second opening portion spaced apart from each other in a first direction, a first split mask group including a plurality of first split masks arranged on the first opening portion in a second direction crossing the first direction, and a second split mask group including a plurality of second split masks arranged on the second opening portion in the second direction, wherein a boundary between adjacent first split masks in the second direction and a boundary between adjacent second split masks in the second direction are at different positions.
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公开(公告)号:US20190067584A1
公开(公告)日:2019-02-28
申请号:US16176012
申请日:2018-10-31
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor: Su Hwan LEE , Eun Ho KIM
Abstract: A deposition mask assembly includes a frame including a first opening portion and a second opening portion spaced apart from each other in a first direction, a first split mask group including a plurality of first split masks arranged on the first opening portion in a second direction crossing the first direction, and a second split mask group including a plurality of second split masks arranged on the second opening portion in the second direction, wherein a boundary between adjacent first split masks in the second direction and a boundary between adjacent second split masks in the second direction are at different positions.
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