METHOD FOR ANALYZING THIN FILM AND DEVICE FOR ANALYZING THIN FILM

    公开(公告)号:US20240077303A1

    公开(公告)日:2024-03-07

    申请号:US18219606

    申请日:2023-07-07

    CPC classification number: G01B11/06 H01J49/105

    Abstract: A method for analyzing a thin film includes: preparing a main sample and a plurality of comparative samples, each of which includes a first layer composed of a first material and a second layer composed of a second material and a third material, the first layer and the second layer being stacked, where each of the plurality of comparative samples has a different amount of the second material from the main sample; measuring optical constants of the main sample and the comparative samples; deriving a linear relation equation between each of the optical constants of the main sample and the comparative samples and the material amount of the second material of a corresponding one of the main sample and the comparative samples; and calculating a material composition ratio of the main sample based on the material amount of the second material of the main sample and the linear relation equation.

    SUBSTRATE PROCESSING APPARATUS AND METHOD OF MEASURING FILM THICKNESS

    公开(公告)号:US20230160688A1

    公开(公告)日:2023-05-25

    申请号:US17955660

    申请日:2022-09-29

    CPC classification number: G01B11/0625 G01B11/0641

    Abstract: A substrate processing apparatus includes a chamber including an accommodation space, a stage disposed in the accommodation space and provided with a substrate disposed thereon, a deposition part disposed under the stage and spraying at least one deposition material to the substrate, and a measurement part disposed adjacent to the deposition part. The measurement part includes an accommodation portion provided with an opening defined through at least one surface thereof, a light source disposed in the accommodation portion and irradiating a first light, at least one transmission portion disposed in the opening, facing the light source, and receiving the first light, and a reception portion facing the at least one transmission portion and receiving the first light reflected from the at least one deposition material as a second light.

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