公开(公告)号：US20180005368A1

公开(公告)日：2018-01-04

申请号：US15198876

申请日：2016-06-30

Applicant: General Electric Company

Inventor： Venkata Vijayaraghava Nalladega ,  Thomas James Batzinger ,  Yuri Alexeyevich Plotnikov ,  Shyamsunder Tondanur Mandayam ,  Bryon Edward Knight ,  Satheesh Jeyaraman ,  Esha SenGupta

IPC: G06T7/00 ,  G06T5/50

CPC classification number: G06T7/0008 ,  G01N25/72 ,  G06T5/50 ,  G06T2207/10016 ,  G06T2207/10048 ,  G06T2207/20221

Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.

公开(公告)号：US10152784B2

公开(公告)日：2018-12-11

申请号：US15198876

申请日：2016-06-30

Applicant: General Electric Company

Inventor： Venkata Vijayaraghava Nalladega ,  Thomas James Batzinger ,  Yuri Alexeyevich Plotnikov ,  Shyamsunder Tondanur Mandayam ,  Bryon Edward Knight ,  Satheesh Jeyaraman ,  Esha SenGupta

IPC: G06T7/00 ,  G01N25/72 ,  G06T5/50

Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.