Abstract:
A method for selecting a field device for ascertaining at least one process parameter of a measured material in process and automation technology, especially a process parameter such as flow, fill level, limit level, pressure, temperature, conductivity and/or ion concentration of a measured material, which field device is provided at a measuring point of a plant for ascertaining at least one process parameter, characterized by steps as follows: A identifying a first field device, which is suitable to determine the at least one process parameter of the measured material at the measuring point of the plant; B querying a first data set stored in a data memory relative to product features of the first field device, which enable ascertaining the at least one process parameter; C comparing at least one product feature of the first data set of the first field device with at least one corresponding product feature of a second data set of a second field device; and D specifying the second field device, to the extent that there is partial or complete agreement of the product features of the first and second data sets.