Thermal conductivity measuring device and method of measuring the thermal conductivity
    1.
    发明授权
    Thermal conductivity measuring device and method of measuring the thermal conductivity 有权
    热导率测量装置及测量导热率的方法

    公开(公告)号:US09170223B2

    公开(公告)日:2015-10-27

    申请号:US13780166

    申请日:2013-02-28

    CPC classification number: G01N25/18

    Abstract: The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.

    Abstract translation: 本发明的概念涉及热导率测量装置和测量热导率的方法。 热导率测量装置可以包括连接到样品的一个侧端并从热源接收热量的第一结构; 连接到样品的另一侧端的第二结构; 连接到第一结构的第一级,同时支撑第一结构; 在支撑所述第二结构的同时连接到所述第二结构的第二级; 连接单元,连接在第一阶段和第二阶段之间; 以及测量单元,测量第一和第二结构以及第一和第二阶段的温度。 由于考虑到测量环境,本发明概念的热导率测量校正了由于从载台发射的热传递引起的级的温度变化,所以可以提高测量的可靠性。

    Thermal conductivity measuring device and method of measuring the thermal conductivity

    公开(公告)号:US09377421B2

    公开(公告)日:2016-06-28

    申请号:US14862678

    申请日:2015-09-23

    CPC classification number: G01N25/18

    Abstract: The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.

    Thermal conductivity measuring device
    3.
    发明授权
    Thermal conductivity measuring device 有权
    热导率测量装置

    公开(公告)号:US09377420B2

    公开(公告)日:2016-06-28

    申请号:US14861909

    申请日:2015-09-22

    CPC classification number: G01N25/18

    Abstract: The inventive concept relates to a thermal conductivity measuring device. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.

    Abstract translation: 本发明的概念涉及热导率测量装置。 热导率测量装置可以包括连接到样品的一个侧端并从热源接收热量的第一结构; 连接到样品的另一侧端的第二结构; 连接到第一结构的第一级,同时支撑第一结构; 在支撑所述第二结构的同时连接到所述第二结构的第二级; 连接单元,连接在第一阶段和第二阶段之间; 以及测量单元,测量第一和第二结构以及第一和第二阶段的温度。 由于考虑到测量环境,本发明概念的热导率测量校正了由于从载台发射的热传递引起的级的温度变化,所以可以提高测量的可靠性。

    THERMAL CONDUCTIVITY MEASURING DEVICE AND METHOD OF MEASURING THE THERMAL CONDUCTIVITY
    4.
    发明申请
    THERMAL CONDUCTIVITY MEASURING DEVICE AND METHOD OF MEASURING THE THERMAL CONDUCTIVITY 有权
    热传导率测量装置及测量热导率的方法

    公开(公告)号:US20140010258A1

    公开(公告)日:2014-01-09

    申请号:US13780166

    申请日:2013-02-28

    CPC classification number: G01N25/18

    Abstract: The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.

    Abstract translation: 本发明的概念涉及热导率测量装置和测量热导率的方法。 热导率测量装置可以包括连接到样品的一个侧端并从热源接收热量的第一结构; 连接到样品的另一侧端的第二结构; 连接到第一结构的第一级,同时支撑第一结构; 在支撑所述第二结构的同时连接到所述第二结构的第二级; 连接单元,连接在第一阶段和第二阶段之间; 以及测量单元,测量第一和第二结构以及第一和第二阶段的温度。 由于考虑到测量环境,本发明概念的热导率测量校正了由于从载台发射的热传递引起的级的温度变化,所以可以提高测量的可靠性。

Patent Agency Ranking