摘要:
Methods and apparatuses for determining a color calibration for different spectral light inputs in an imaging apparatus measurement are disclosed herein. In one embodiment, for example, a method for determining a color calibration for different spectral light inputs in an imaging apparatus measurement can include creating a reference color calibration and a reference luminance scaling calibration for each of a plurality of colors. The method can also include measuring a reference gray value R, G, B for each color in an image measurement of the light source. The method can further include calculating an R, G, B gray value for a first pixel in each of three filtered image measurements. The method can then include calculating pixel ratio values from each of the three first pixel gray values and comparing the reference gray values to the pixel ratio values to determine which one or more reference gray values are closest to the pixel ratio values. The method further includes calculating X, Y, Z values for the first pixel in the image measurement, and then repeating the steps of the method beginning with calculating an R, G, B gray value for each subsequent pixel in the image measurement.
摘要:
Methods and apparatuses for determining a color calibration for different spectral light inputs in an imaging apparatus measurement are disclosed herein. In one embodiment, for example, a method for determining a color calibration for different spectral light inputs in an imaging apparatus measurement can include creating a reference color calibration and a reference luminance scaling calibration for each of a plurality of colors. The method can also include measuring a reference gray value R, G, B for each color in an image measurement of the light source. The method can further include calculating an R, G, B gray value for a first pixel in each of three filtered image measurements. The method can then include calculating pixel ratio values from each of the three first pixel gray values and comparing the reference gray values to the pixel ratio values to determine which one or more reference gray values are closest to the pixel ratio values. The method further includes calculating X, Y, Z values for the first pixel in the image measurement, and then repeating the steps of the method beginning with calculating an R, G, B gray value for each subsequent pixel in the image measurement.
摘要:
Rotary shutter assemblies for imaging photometers and methods for using such shutters are disclosed herein. In one embodiment, for example, a method for capturing an image with an imaging photometer can include positioning a rotary shutter having an aperture at a first position such that the shutter blocks light traveling along an optical axis from a light source being measured to an image sensor of the photometer. The method can include pivotably moving the shutter at a generally constant angular speed to a second position with the aperture aligned with the optical axis to expose at least a portion of the image sensor to the light for a first predetermined exposure time. After exposing each portion of the image sensor to the light for the first exposure time, the method can include pivotably moving the shutter at the angular speed to a third position such the aperture is not aligned the optical axis, and then pivotably moving the shutter from the third position back to the first position without rotating the shutter 360 degrees.
摘要:
Rotary shutter assemblies for imaging photometers and methods for using such shutters are disclosed herein. In one embodiment, for example, a method for capturing an image with an imaging photometer can include positioning a rotary shutter having an aperture at a first position such that the shutter blocks light traveling along an optical axis from a light source being measured to an image sensor of the photometer. The method can include pivotably moving the shutter at a generally constant angular speed to a second position with the aperture aligned with the optical axis to expose at least a portion of the image sensor to the light for a first predetermined exposure time. After exposing each portion of the image sensor to the light for the first exposure time, the method can include pivotably moving the shutter at the angular speed to a third position such the aperture is not aligned the optical axis, and then pivotably moving the shutter from the third position back to the first position without rotating the shutter 360 degrees.
摘要:
The present disclosure is directed to imaging device, systems, and methods for collecting optical data for use with spectrometers. An imaging device configured in accordance with one aspect of the disclosure includes a lens configured to introduce light into the imaging device along an optical path, and an image sensor spaced apart from the lens and configured to receive at least a portion of the light along the optical path. The imaging device further includes a filter assembly positioned between the lens and the image sensor, and a reflector or mirror carried by the filter assembly. The filter assembly is configured to move the reflector between first and second positions. In the first position the reflector is at least partially aligned with the optical path and reflects at least a portion of the light to a corresponding light input for a spectrometer. In the second position the reflector is positioned outside of the optical path.
摘要:
The present disclosure is directed to imaging device, systems, and methods for collecting optical data for use with spectrometers. An imaging device configured in accordance with one aspect of the disclosure includes a lens configured to introduce light into the imaging device along an optical path, and an image sensor spaced apart from the lens and configured to receive at least a portion of the light along the optical path. The imaging device further includes a filter assembly positioned between the lens and the image sensor, and a reflector or mirror carried by the filter assembly. The filter assembly is configured to move the reflector between first and second positions. In the first position the reflector is at least partially aligned with the optical path and reflects at least a portion of the light to a corresponding light input for a spectrometer. In the second position the reflector is positioned outside of the optical path.