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1.
公开(公告)号:US20240280630A1
公开(公告)日:2024-08-22
申请号:US18651462
申请日:2024-04-30
Applicant: Cisco Technology, Inc.
Inventor: Sanjay SUNDER , Alexander C. KURYLAK
IPC: G01R31/28
CPC classification number: G01R31/2853 , G01R31/2856
Abstract: Techniques for testing connectivity between a first integrated circuit (IC) and a second IC of an electronics package are described. An example technique involves controlling a switch(es) in the first IC to configure a bias direction of a photodiode of the second IC to forward biased. A connectivity test between the first and second ICs is performed, when the photodiode is forward biased. Another technique involves controlling a switch(es) in the first IC to configure a bias direction of a photodiode in the second IC to reverse biased. A first voltage is measured at an input of a transimpedance amplifier (TIA) in the first IC when the photodiode is reverse biased. The switch(es) are controlled to change the bias direction of the photodiode to forward biased. A second voltage is measured at the input of the TIA when the photodiode is forward biased.
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公开(公告)号:US20240421772A1
公开(公告)日:2024-12-19
申请号:US18813356
申请日:2024-08-23
Applicant: Cisco Technology, Inc.
Inventor: Craig S. APPEL , Peter C. METZ , Joseph V. PAMPANIN , Sanjay SUNDER
Abstract: Embodiments provide for a tunable driving circuit by monitoring a frequency of a ring oscillator of an electrical integrated circuit connected to an optical modulator to determine operational characteristics of the electrical integrated circuit; setting, based on the operational characteristics, a driving voltage for a plurality of tunable inverters and a plurality of fixed gain inverters that control the optical modulator, wherein each tunable inverter of the plurality of tunable inverters is connected in parallel with a corresponding fixed gain inverter of the plurality of fixed gain inverters on one of a first arm and a second arm connected to the optical modulator; and setting an amplification strength for the plurality of tunable inverters based on the operational characteristics.
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公开(公告)号:US20210382106A1
公开(公告)日:2021-12-09
申请号:US17445616
申请日:2021-08-23
Applicant: Cisco Technology, Inc.
Inventor: Sanjay SUNDER , Prajwal M. KASTURI , Joseph V. PAMPANIN , Craig S. APPEL
IPC: G01R31/28
Abstract: The fault detection system described provides an efficient method to test and monitor component to component connectivity in an electronic package using on chip test circuits and on chip components, which reduces the need for external testing equipment and analysis. The on chip nature allows for both real time testing in the assembly process of the electronic packages and during use of the electronic package by determining an on chip reference measurement and using the reference measurement to determine an operational status of the package.
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4.
公开(公告)号:US20240019485A1
公开(公告)日:2024-01-18
申请号:US17813203
申请日:2022-07-18
Applicant: Cisco Technology, Inc.
Inventor: Sanjay SUNDER , Alexander C. KURYLAK
IPC: G01R31/28
CPC classification number: G01R31/2853 , G01R31/2856
Abstract: Techniques for testing connectivity between a first integrated circuit (IC) and a second IC of an electronics package are described. An example technique involves controlling a switch(es) in the first IC to configure a bias direction of a photodiode of the second IC to forward biased. A connectivity test between the first and second ICs is performed, when the photodiode is forward biased. Another technique involves controlling a switch(es) in the first IC to configure a bias direction of a photodiode in the second IC to reverse biased. A first voltage is measured at an input of a transimpedance amplifier (TIA) in the first IC when the photodiode is reverse biased. The switch(es) are controlled to change the bias direction of the photodiode to forward biased. A second voltage is measured at the input of the TIA when the photodiode is forward biased.
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公开(公告)号:US20230100245A1
公开(公告)日:2023-03-30
申请号:US17448822
申请日:2021-09-24
Applicant: Cisco Technology, Inc.
Inventor: Sanjay SUNDER , Alexander C. KURYLAK , Kadaba LAKSHMIKUMAR
Abstract: An integrated circuit includes a transimpedance amplifier and an injection circuit. The injection circuit generates a first electrical test signal and injects the first electrical test signal into the transimpedance amplifier. The first electrical test signal or an output of the transimpedance amplifier generated based on the first electrical test signal is used to determine whether the integrated circuit is faulty.
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公开(公告)号:US20220337194A1
公开(公告)日:2022-10-20
申请号:US17810792
申请日:2022-07-05
Applicant: Cisco Technology, Inc.
Inventor: Craig S. APPEL , Peter C. METZ , Joseph V. PAMPANIN , Sanjay SUNDER
Abstract: Embodiments provide for a tunable driving circuit by monitoring a frequency of a ring oscillator of an electrical integrated circuit connected to an optical modulator to determine operational characteristics of the electrical integrated circuit; setting, based on the operational characteristics, a driving voltage for a plurality of tunable inverters and a plurality of fixed gain inverters that control the optical modulator, wherein each tunable inverter of the plurality of tunable inverters is connected in parallel with a corresponding fixed gain inverter of the plurality of fixed gain inverters on one of a first arm and a second arm connected to the optical modulator; and setting an amplification strength for the plurality of tunable inverters based on the operational characteristics.
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公开(公告)号:US20200373885A1
公开(公告)日:2020-11-26
申请号:US16417295
申请日:2019-05-20
Applicant: Cisco Technology, Inc.
Inventor: Craig S. APPEL , Peter C. METZ , Joseph V. PAMPANIN , Sanjay SUNDER
Abstract: Embodiments provide for a tunable driving circuit by monitoring a frequency of a ring oscillator of an electrical integrated circuit connected to an optical modulator to determine operational characteristics of the electrical integrated circuit; setting, based on the operational characteristics, a driving voltage for a plurality of tunable inverters and a plurality of fixed gain inverters that control the optical modulator, wherein each tunable inverter of the plurality of tunable inverters is connected in parallel with a corresponding fixed gain inverter of the plurality of fixed gain inverters on one of a first arm and a second arm connected to the optical modulator; and setting an amplification strength for the plurality of tunable inverters based on the operational characteristics.
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