公开(公告)号：US10408875B2

公开(公告)日：2019-09-10

申请号：US15183253

申请日：2016-06-15

Applicant: Advanced Semiconductor Engineering, Inc.

Inventor： Yu-Jung Chang ,  Wei-Kai Liao ,  Ming-Ching Lin ,  Kuei-Hao Tseng

IPC: G01R31/02 ,  G01R31/26 ,  G01R31/28

Abstract: A testing system includes a subtractor and a divider. The subtractor is configured to receive a first voltage of a circuit being tested and a second voltage of the circuit, and to derive a difference between the first voltage and the second voltage. The divider is configured to receive the difference between the first voltage and the second voltage, and to derive a resistance of the circuit by dividing (i) the difference between the first voltage and the second voltage by (ii) a difference between a first current applied to the circuit and a second current applied to the circuit. The first voltage is corresponding to the first current, and the second voltage is corresponding to the second current.