Reissue Patent
USRE39823E1 Vacuum processing operating method with wafers, substrates and/or semiconductors
失效
具有晶片,基板和/或半导体的真空处理操作方法
- Patent Title: Vacuum processing operating method with wafers, substrates and/or semiconductors
- Patent Title (中): 具有晶片,基板和/或半导体的真空处理操作方法
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Application No.: US10060304Application Date: 2002-02-01
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Publication No.: USRE39823E1Publication Date: 2007-09-11
- Inventor: Shigekazu Kato , Kouji Nishihata , Tsunehiko Tsubone , Atsushi Itou
- Applicant: Shigekazu Kato , Kouji Nishihata , Tsunehiko Tsubone , Atsushi Itou
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout and Kraus, LLP.
- Priority: JP2-225321 19900829
- Main IPC: F26B5/04
- IPC: F26B5/04

Abstract:
This invention relates to a vacuum processing apparatus having vacuum processing chambers the insides of which must be dry cleaned, and to a method of operating such an apparatus. When the vacuum processing chambers are dirty-cleaned, dummy substrates are transferred into the vacuum processing chamber by substrates conveyor means from dummy substrate storage means which is disposed in the air atmosphere together with storage means for storing substrates to be processed, and the inside of the vacuum processing chamber is dry-cleaned by generating a plasma. The dummy substrate is returned to the dummy substrate storage means after dry cleaning is completed. Accordingly, any specific mechanism for only the cleaning purpose is not necessary and the construction of the apparatus can be made simple. Furthermore, the dummy substrates used for dry cleaning and the substrates to be processed do not coexist, contamination of the substrates to be processed due to dust and remaining gas can be prevented and the production yield can be high.
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