- 专利标题: Flow over wire die attach film and conductive molding compound to provide an electromagnetic interference shield for a semiconductor die
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申请号: US15474904申请日: 2017-03-30
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公开(公告)号: US09953933B1公开(公告)日: 2018-04-24
- 发明人: Aaron Cadag , Rennier Rodriguez , Ela Mia Cadag
- 申请人: STMicroelectronics, Inc.
- 申请人地址: PH Calamba
- 专利权人: STMICROELECTRONICS, INC.
- 当前专利权人: STMICROELECTRONICS, INC.
- 当前专利权人地址: PH Calamba
- 代理机构: Seed IP Law Group LLP
- 主分类号: H01L23/552
- IPC分类号: H01L23/552 ; H01L23/00 ; B32B7/12 ; H01L21/78 ; H01L23/498 ; H01L23/31 ; H01L21/56 ; H01L21/48
摘要:
A semiconductor package includes a substrate, a die, an insulating die attach film, a dummy die, a conductive layer, and an electrically conductive molding compound or encapsulant. The first surface of the substrate includes a plurality of internal leads, and the second surface of the substrate includes a plurality of external electrically conductive pads and an electrically conductive ground terminal. A non-conductive flow over wire die attach film is placed to surround and encase the die. The dummy die overlies the die and a conductive layer overlies the dummy die. The electrically conductive molding compound is formed to encase the various components of the semiconductor device. The electrically conductive molding compound is electrically coupled to the electrically conductive ground terminal and the conductive layer forming an EMI shield for the die in the package.
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