Invention Grant
- Patent Title: Thin film device with protective layer
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Application No.: US15235142Application Date: 2016-08-12
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Publication No.: US09935283B2Publication Date: 2018-04-03
- Inventor: Anthony J. Annunziata , Ching-Tzu Chen , Joel D. Chudow
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Edward J. Wixted, III
- Main IPC: H01L51/05
- IPC: H01L51/05 ; H01L29/786 ; H01L29/16 ; H01L29/06 ; H01L21/02 ; H01L21/283 ; H01L29/20 ; H01L29/24 ; H01L21/04 ; H01L51/00 ; H01L21/441 ; H01L29/66 ; H01L29/778 ; G01N27/414 ; H01L43/08 ; H01L49/02 ; H01L23/532 ; H01L21/768
![Thin film device with protective layer](/abs-image/US/2018/04/03/US09935283B2/abs.jpg.150x150.jpg)
Abstract:
Embodiments of the invention include a method for fabricating a semiconductor device and the resulting structure. A substrate is provided. A plurality of metal portions are formed on the substrate, wherein the plurality of metal portions are arranged such that areas of the substrate remain exposed. A thin film layer is deposited on the plurality of metal portions and the exposed areas of the substrate. A dielectric layer is deposited, wherein the dielectric layer is in contact with portions of the thin film layer on the plurality of metal portions, and wherein the dielectric layer is not in contact with portions of the thin film layer on the exposed areas of the substrate such that one or more enclosed spaces are present between the thin film layer on the exposed areas of the substrate and the dielectric layer.
Public/Granted literature
- US20160351840A1 THIN FILM DEVICE WITH PROTECTIVE LAYER Public/Granted day:2016-12-01
Information query
IPC分类: