- 专利标题: Method for void-free cobalt gap fill
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申请号: US14873152申请日: 2015-10-01
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公开(公告)号: US09748137B2公开(公告)日: 2017-08-29
- 发明人: Chiukin Steven Lai , Jeong-Seok Na , Raihan Tarafdar , Raashina Humayun , Michal Danek
- 申请人: Lam Research Corporation
- 申请人地址: US CA Fremont
- 专利权人: Lam Research Corporation
- 当前专利权人: Lam Research Corporation
- 当前专利权人地址: US CA Fremont
- 代理机构: Weaver Austin Villeneuve & Sampson LLP
- 主分类号: H01L21/44
- IPC分类号: H01L21/44 ; H01L21/768 ; H01L21/285 ; H01L21/02 ; H01J37/32 ; C23C16/04 ; H01L23/532
摘要:
Provided herein are methods of depositing void-free cobalt into features with high aspect ratios. Methods involve (a) partially filling a feature with cobalt, (b) exposing the feature to a plasma generated from nitrogen-containing gas to selectively inhibit cobalt nucleation on surfaces near or at the top of the feature, optionally repeating (a) and (b), and depositing bulk cobalt into the feature by chemical vapor deposition. Methods may also involve exposing a feature including a barrier layer to a plasma generated from nitrogen-containing gas to selectively inhibit cobalt nucleation. The methods may be performed at low temperatures less than about 400° C. using cobalt-containing precursors. Methods may also involve using a remote plasma source to generate the nitrogen-based plasma. Methods also involve annealing the substrate.
公开/授权文献
- US20160056077A1 METHOD FOR VOID-FREE COBALT GAP FILL 公开/授权日:2016-02-25
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