发明授权
- 专利标题: Microtomic system and process utilizing electrostatic force to handle sample sections
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申请号: US15208940申请日: 2016-07-13
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公开(公告)号: US09719889B2公开(公告)日: 2017-08-01
- 发明人: Zhongwei Chen
- 申请人: Focus e-Beam Technology (Beijing) Co., Ltd.
- 申请人地址: CN Beijing
- 专利权人: Focus e-Beam Technology (Beijing) Co., Ltd.
- 当前专利权人: Focus e-Beam Technology (Beijing) Co., Ltd.
- 当前专利权人地址: CN Beijing
- 代理机构: United States Research and Patent Firm
- 代理商 Guosheng Wang
- 主分类号: G01N1/06
- IPC分类号: G01N1/06 ; B26D7/18 ; G01N1/28
摘要:
Provided is a process of using a microtomic system for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.
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