Invention Grant
- Patent Title: Method of reducing the thickness of a target sample
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Application No.: US14890114Application Date: 2014-05-12
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Publication No.: US09704689B2Publication Date: 2017-07-11
- Inventor: Christian Lang , Peter Statham , Cheryl Hartfield
- Applicant: Oxford Instruments Nanotechnology Tools Limited
- Applicant Address: GB Oxon
- Assignee: Oxford Instruments Nanotechnology Tools Limited
- Current Assignee: Oxford Instruments Nanotechnology Tools Limited
- Current Assignee Address: GB Oxon
- Agency: Blank Rome LLP
- Priority: GB1308436.3 20130510
- International Application: PCT/GB2014/051441 WO 20140512
- International Announcement: WO2014/181132 WO 20141113
- Main IPC: H01J37/285
- IPC: H01J37/285 ; H01J37/30 ; H01J37/305 ; H01J37/304

Abstract:
A method is provided of reducing the thickness of a region of a target sample. Reference data is obtained that is representative of x-rays generated by a particle beam being directed upon part of a reference sample under a first set of beam conditions. Under a second set of beam conditions the particle beam is directed upon the region of the target sample. The resultant x-rays are monitored as monitored data. Output data are then calculated based upon the reference and the monitored data. Material is then removed from the region, so as to reduce its thickness, in accordance with the output data.
Public/Granted literature
- US20160093468A1 METHOD OF REDUCING THE THICKNESS OF A TARGET SAMPLE Public/Granted day:2016-03-31
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