Fault detection optimized electronic circuit includes a circuit substrate on which components of the electronic circuit are respectively disposed. Each of the components has a component body which includes at least a first and second contacts. A component trace formed of conductive material is disposed on a first exterior surface of each component body facing the substrate. The component trace is electrically insulated from the first and second contact. Each of the components contains a network consisting of at least two capacitors connected in series between the first and second contact. A test point is formed of conductive material disposed on a second exterior surface of each body. The test point is electrically isolated from the first and second contacts and electrically connected to at least the component trace.