Invention Grant
- Patent Title: Laser alignment and calibration system for scanning lasers
- Patent Title (中): 用于扫描激光器的激光对准和校准系统
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Application No.: US14510003Application Date: 2014-10-08
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Publication No.: US09588252B2Publication Date: 2017-03-07
- Inventor: Theodore Bruce Ziemkowski , John Bonvallet , Devon Clark , Peeraya Nilwong , Frank Kennedy , Patrick Simons
- Applicant: Z-Image, LLC
- Agency: Krajec Patent Offices, LLC
- Agent Russell Krajec
- Main IPC: G01J1/20
- IPC: G01J1/20 ; G01V13/00 ; G01V8/18

Abstract:
A two dimensional scanning laser system may automatically detect a laser, then align and calibrate itself to scan over the sensor area. The system may have a laser with a controller that may cause the laser to be directed over two dimensions, as well as a sensor apparatus. The laser may be controlled with a mirror system that may pivot in two directions, thus allowing the laser to be scanned over a two dimensional area. The sensor may be a point sensor, where the laser may be positioned in a constant direction, as well as a larger area sensor where the laser may be moved across the sensor area to detect objects in a two or three dimensional space. An alignment and calibration sequence may cause the laser to scan across its operational area and detect the location of one or more sensors.
Public/Granted literature
- US20160170084A1 Laser Alignment and Calibration System for Scanning Lasers Public/Granted day:2016-06-16
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