发明授权
- 专利标题: Laser alignment and calibration system for scanning lasers
- 专利标题(中): 用于扫描激光器的激光对准和校准系统
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申请号: US14510003申请日: 2014-10-08
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公开(公告)号: US09588252B2公开(公告)日: 2017-03-07
- 发明人: Theodore Bruce Ziemkowski , John Bonvallet , Devon Clark , Peeraya Nilwong , Frank Kennedy , Patrick Simons
- 申请人: Z-Image, LLC
- 代理机构: Krajec Patent Offices, LLC
- 代理商 Russell Krajec
- 主分类号: G01J1/20
- IPC分类号: G01J1/20 ; G01V13/00 ; G01V8/18
摘要:
A two dimensional scanning laser system may automatically detect a laser, then align and calibrate itself to scan over the sensor area. The system may have a laser with a controller that may cause the laser to be directed over two dimensions, as well as a sensor apparatus. The laser may be controlled with a mirror system that may pivot in two directions, thus allowing the laser to be scanned over a two dimensional area. The sensor may be a point sensor, where the laser may be positioned in a constant direction, as well as a larger area sensor where the laser may be moved across the sensor area to detect objects in a two or three dimensional space. An alignment and calibration sequence may cause the laser to scan across its operational area and detect the location of one or more sensors.
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