发明授权
- 专利标题: Transfer unit of test handler and method of operating the same
- 专利标题(中): 测试处理程序的传送单元及其操作方法
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申请号: US13894608申请日: 2013-05-15
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公开(公告)号: US09573235B2公开(公告)日: 2017-02-21
- 发明人: Jong-An Lee , Bum-Sic Kim , Young-Gil Lee , Chea-Geun Lim
- 申请人: Samsung Electronics Co., Ltd
- 申请人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 代理机构: Muir Patent Law, PLLC
- 优先权: KR10-2012-0083256 20120730
- 主分类号: B23Q15/22
- IPC分类号: B23Q15/22 ; B25J17/02 ; G01R31/28
摘要:
A transfer unit of a test handler includes a base frame, a floating assembly, and an arm part. The base frame includes an inserted portion having a penetration hole. The inserted portion including an upper inserted portion disposed near an upper surface of the inserted portion, a lower portion disposed near a lower portion of the inserted portion and a middle inserted portion disposed between the upper inserted portion and the lower inserted portion. The floating assembly is inserted in the penetration hole of the base frame. The floating assembly includes a floating part, an elastic element, and a coupling element. The floating assembly moves back and forth, to left and right sides, and up and down, or flows within a predetermined angle range in the penetration hole.
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