发明授权
- 专利标题: Electroless metal through silicon via
- 专利标题(中): 无电金属通过硅通孔
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申请号: US14431002申请日: 2013-09-27
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公开(公告)号: US09514985B2公开(公告)日: 2016-12-06
- 发明人: Thorbjorn Ebefors , Henrik Knutsson
- 申请人: SILEX MICROSYSTEMS AB
- 申请人地址: SE Jarfalla
- 专利权人: SILEX MICROSYSTEMS AB
- 当前专利权人: SILEX MICROSYSTEMS AB
- 当前专利权人地址: SE Jarfalla
- 代理机构: Young & Thompson
- 优先权: SE1251089 20120927
- 国际申请: PCT/SE2013/051124 WO 20130927
- 国际公布: WO2014/051511 WO 20140403
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L21/768 ; H01L21/288 ; H01L23/48 ; H01L21/02
摘要:
A method of making a substrate-through metal via having a high aspect ratio, in a semiconductor substrate, and a metal pattern on the substrate surface, includes providing a semiconductor substrate (wafer) and depositing poly-silicon on the substrate. The poly-silicon on the substrate surface is patterned by etching away unwanted portions. Then, Ni is selectively deposited on the poly-silicon by an electroless process. A via hole is made through the substrate, wherein the walls in the hole is subjected to the same processing as above. Cu is deposited on the Ni by a plating process. Line widths and spacings
公开/授权文献
- US20150255344A1 ELECTROLESS METAL THROUGH SILICON VIA 公开/授权日:2015-09-10
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