Invention Grant
US09455667B2 Fractional-N all digital phase locked loop incorporating look ahead time to digital converter 有权
分数N全数字锁相环结合了数字转换器的前瞻时间

Fractional-N all digital phase locked loop incorporating look ahead time to digital converter
Abstract:
A novel and useful look-ahead time to digital converter (TDC) that is applied to an all digital phase locked loop (ADPLL) as the fractional phase error detector. The deterministic nature of the phase error during frequency/phase lock is exploited to achieve a reduction in power consumption of the TDC. The look-ahead TDC circuit is used to construct a cyclic DTC-TDC pair which functions to reduce fractional spurs of the output spectrum in near-integer channels by randomly rotating the cyclic DTC-TDC structure so that it starts from a different point every reference clock thereby averaging out the mismatch of the elements. Associated rotation and dithering methods are also presented. The ADPLL is achieved using the look-ahead TDC and/or cyclic DTC-TDC pair circuit.
Information query
Patent Agency Ranking
0/0