发明授权
- 专利标题： Transient voltage suppression protection circuit including built in testing
- 专利标题（中）： 瞬态电压抑制保护电路，内置测试
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申请号： US13859810申请日： 2013-04-10
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公开(公告)号： US09383405B2公开(公告)日： 2016-07-05
- 发明人: Gary L. Hess , James Quigley, Jr.
- 申请人： Hamilton Sundstrand Corporation
- 申请人地址： US CT Windsor Locks
- 专利权人： Hamilton Sundstrand Corporation
- 当前专利权人： Hamilton Sundstrand Corporation
- 当前专利权人地址： US CT Windsor Locks
- 代理机构： Carlson, Gaskey & Olds, P.C.
- 主分类号： H02H9/04
- IPC分类号： H02H9/04 ; G01R31/28
摘要：
A lightning protection circuit includes a first lightning protection branch including at least one transient voltage suppression (TVS) protection element, and a testing element integral to the lightning protection circuit. The testing element is operable to test a functionality of the lightning protection circuit while he lightning protection circuit is installed in an electronic control system. A controller is connected to the testing element, such that the controller receives sensed signals from the testing element.
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