- 专利标题: Process for forming package-on-package structures
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申请号: US14825722申请日: 2015-08-13
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公开(公告)号: US09373610B2公开(公告)日: 2016-06-21
- 发明人: Chih-Wei Lin , Ming-Da Cheng , Meng-Tse Chen , Wen-Hsiung Lu , Kuei-Wei Huang , Chung-Shi Liu
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater Matsil, LLP
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L25/00 ; H01L21/56 ; H01L25/065 ; H01L21/786 ; H01L21/311 ; H01L23/00 ; H01L21/3105 ; H01L25/10 ; H01L23/538 ; H01L23/522 ; H01L23/31 ; H01L23/498
摘要:
A device includes an inter-layer dielectric, a device die under the inter-layer dielectric; and a die-attach film under the inter-layer dielectric and over the device die, wherein the die-attach film is attached to the device die. A plurality of redistribution lines includes portions level with the die-attach film. A plurality of Z-interconnects is electronically coupled to the device die and the plurality of redistribution lines. A polymer-comprising material is under the inter-layer dielectric. The device die, the die-attach film, and the plurality of Z-interconnects are disposed in the polymer-comprising material.
公开/授权文献
- US20150348957A1 Process for Forming Package-on-Package Structures 公开/授权日:2015-12-03
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