发明授权
- 专利标题： Identifying a defect in a data-storage medium
- 专利标题（中）： 识别数据存储介质中的缺陷
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申请号： US12860653申请日： 2010-08-20
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公开(公告)号： US09324370B2公开(公告)日： 2016-04-26
- 发明人: Shayan Srinivasa Garani , Sivagnanam Parthasarathy
- 申请人： Shayan Srinivasa Garani , Sivagnanam Parthasarathy
- 申请人地址： US TX Coppell
- 专利权人： STMICROELECTRONICS, INC.
- 当前专利权人： STMICROELECTRONICS, INC.
- 当前专利权人地址： US TX Coppell
- 代理机构： Allen, Dyer, Doppelt, Milbrath & Gilchrist, P.A.
- 主分类号： G11B27/36
- IPC分类号： G11B27/36 ; G11B20/18 ; G11B20/10
摘要：
An embodiment of a data-read path includes a defect detector and a data-recovery circuit. The defect detector is operable to identify a defective region of a data-storage medium, and the data-recovery circuit is operable to recover data from the data-storage medium in response to the defect detector. For example, such an embodiment may allow identifying a defective region of a data-storage disk caused, e.g., by a scratch or contamination, and may allow recovering data that was written to the defective region.
公开/授权文献
- US20120047396A1 IDENTIFYING A DEFECT IN A DATA-STORAGE MEDIUM 公开/授权日：2012-02-23
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