Invention Grant
- Patent Title: Systems and methods for distortion characterization
- Patent Title (中): 用于失真表征的系统和方法
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Application No.: US14217886Application Date: 2014-03-18
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Publication No.: US09240199B2Publication Date: 2016-01-19
- Inventor: Xiufeng Song
- Applicant: LSI Corporation
- Applicant Address: SG Singapore
- Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Main IPC: G11B5/09
- IPC: G11B5/09 ; G11B20/18 ; G11B20/10 ; G11B27/36

Abstract:
Systems, methods, devices and circuits for data amplification, and more particularly systems and methods for characterizing distortion introduced during data amplification. In some cases, an amplifier modeling circuit is discussed that receives a preamplifier status input from a preamplifier circuit; applies a vector fitting algorithm to the preamplifier status to yield a pole value; determines that the pole value is greater than unity; and replaces the pole value with an inverse of the pole value when the pole value is greater than unity.
Public/Granted literature
- US20150262592A1 Systems and Methods for Distortion Characterization Public/Granted day:2015-09-17
Information query
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