发明授权
US09214877B2 Gate driving circuit having a fault detecting circuit for a semiconductor switching device
有权
栅极驱动电路具有用于半导体开关器件的故障检测电路
- 专利标题: Gate driving circuit having a fault detecting circuit for a semiconductor switching device
- 专利标题(中): 栅极驱动电路具有用于半导体开关器件的故障检测电路
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申请号: US14042806申请日: 2013-10-01
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公开(公告)号: US09214877B2公开(公告)日: 2015-12-15
- 发明人: Satoki Takizawa
- 申请人: FUJI ELECTRIC CO., LTD.
- 申请人地址: JP
- 专利权人: FUJI ELECTRIC CO., LTD.
- 当前专利权人: FUJI ELECTRIC CO., LTD.
- 当前专利权人地址: JP
- 代理机构: Rossi, Kimms & McDowell LLP
- 优先权: JP2012-223842 20121009
- 主分类号: H03K17/687
- IPC分类号: H03K17/687 ; H02M7/537 ; H02M7/538 ; G01R31/02 ; H03K17/082 ; H02M1/32 ; G01R31/327 ; G01R31/26
摘要:
Aspects of the invention are directed to a gate driving circuit for a power conversion circuit having an upper and lower arm circuit composed of series-connected upper arm and a lower arm, each arm including two or more semiconductor switching devices connected in series. In some aspects, a gate driving circuit of the invention includes a circuit of series connection including a diode and a resistor between a positive potential side of a positive side power supply and a positive electrode side. The gate driving circuit can determine a short-circuit fault of the semiconductor switching device that is connected to the gate driving circuit by detecting the current that flows through the circuit of series connection including the diode and the resistor when an OFF command of ON/OFF command signals is given to the semiconductor switching device.
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