Invention Grant
- Patent Title: Apparatus and method for extreme ultraviolet spectrometer calibration
- Patent Title (中): 用于极紫外光谱仪校准的仪器和方法
-
Application No.: US14490948Application Date: 2014-09-19
-
Publication No.: US09188485B1Publication Date: 2015-11-17
- Inventor: Sun Ho Kim , Yong Soo Kim , Jae Hun Kim , Min-Chul Park , Young Tae Byun , Min Ah Seo , Joon Mo Ahn , Deok Ha Woo , Seok Lee , Taik Jin Lee , Young Min Jhon
- Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- Applicant Address: KR Seoul
- Assignee: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
- Current Assignee Address: KR Seoul
- Agency: Ladas & Parry LLP
- Priority: KR10-2014-0065251 20140529
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01J3/02 ; G01J3/10 ; G01J3/28

Abstract:
Disclosed are herein an apparatus and method for extreme ultraviolet (EUV) spectroscope calibration. The apparatus for EUV spectroscope calibration includes an EUV generating module, an Al filter, a diffraction grating, a CCD camera, a spectrum conversion module, and a control module that compares a wavelength value corresponding to a maximum peak among peaks of the spectrum depending on the order of the EUV light converted from the spectrum conversion module with a predetermined reference wavelength value depending on an order of high-order harmonics to calculate a difference value with the closest reference wavelength value, and controls the spectrum depending on the order of the EUV light converted from the spectrum conversion module to be moved in a direction of wavelength axis by the calculated difference value. Thus, it is possible to accurately measure a wavelength of a spectrum of EUV light used in EUV exposure technology and mask inspection technology.
Public/Granted literature
- US20150346029A1 APPARATUS AND METHOD FOR EXTREME ULTRAVIOLET SPECTROMETER CALIBRATION Public/Granted day:2015-12-03
Information query